Wu, M.F.; Zhou, S.; Yao, S.; Zhao, Q.; Vantomme, A.; van Daele, B.; Piscopiello, E.; Van Tendeloo, G.; Tong, Y.Z.; Yang, Z.J.; Yu, T.J.; Zhang, G.Y. |
High precision determination of the elastic strain of InGaN/GaN multiple quantum wells |
2004 |
Journal of vacuum science and technology: B: microelectronics and nanometer structures |
22 |
15 |
UA library record; WoS full record; WoS citing articles |