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Author
Title
Year
Publication
Volume
Times cited
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Ke, X.
;
Bals, S.
;
Romo Negreira, A.
;
Hantschel, T.
;
Bender, H.
;
Van Tendeloo, G.
TEM sample preparation by FIB for carbon nanotube interconnects
2009
Ultramicroscopy
109
21
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