Author |
Title |
Year |
Publication |
Volume |
Times cited ![sorted by Times cited field, descending order (down)](img/sort_desc.gif) |
Additional Links |
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2006 |
Analytical chemistry |
78 |
112 |
UA library record; WoS full record; WoS citing articles |
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy: a review |
2010 |
Analytical chemistry |
82 |
65 |
UA library record; WoS full record; WoS citing articles |
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2008 |
Analytical chemistry |
80 |
53 |
UA library record; WoS full record; WoS citing articles |
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2004 |
Analytical chemistry |
76 |
32 |
UA library record; WoS full record; WoS citing articles |
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2013 |
Analytical chemistry |
85 |
29 |
UA library record; WoS full record; WoS citing articles |
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2002 |
Analytical chemistry |
74 |
18 |
UA library record; WoS full record; WoS citing articles |
Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. |
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison |
2007 |
|
|
|
UA library record |
Xhoffer, C.; Jacob, W.; Van Grieken, R.; Broekaert, J.A.C.; Buseck, P. |
Electron energy-loss spectroscopy and its application to individual particle analysis |
1992 |
|
|
|
UA library record |
Alfeld, M.; Broekaert, J.A.C. |
Mobile depth profiling and sub-surface imaging techniques for historical paintings : a review |
2013 |
Spectrochimica acta: part B : atomic spectroscopy |
88 |
|
UA library record; WoS full record; WoS citing articles |