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“
Elemental trace analysis of small samples by proton-induced X-ray-emission
”. Johansson TB, Van Grieken RE, Nelson JW, Winchester JW, Analytical chemistry
47
, 855 (1975). http://doi.org/10.1021/AC60356A035
Keywords:
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI:
10.1021/AC60356A035
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