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| Record | |||||
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| Author | Schryvers, D.; Goessens, C.; van Renterghem, W.; van Landuyt, J.; de Keyzer, R. | ||||
| Title | Conventional and HREM study of structural defects in nanostructured silver halides | Type | P3 Proceeding | ||
| Year | 1998 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 1-6 | ||
| Keywords | P3 Proceeding; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Antwerpen | Editor | ||
| Language | Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited  |
Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:29681 | Serial | 509 | ||
| Permanent link to this record | |||||