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Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J. | ||||
Title | Physical limits on atomic resolution | Type | A1 Journal article | ||
Year | 2004 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 10 | Issue | Pages | 153-157 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | 000188882100022 | Publication Date | 2004-08-11 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.891 | Times cited | 14 | Open Access | |
Notes | Approved | Most recent IF: 1.891; 2004 IF: 2.389 | |||
Call Number | UA @ lucian @ c:irua:47515 | Serial | 2616 | ||
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