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Author Hadermann, J.; Palatinus, L. url  doi
openurl 
  Title Introducton to the special issue on electron crystallography Type Editorial
  Year 2019 Publication And Materials Abbreviated Journal  
  Volume 75 Issue 4 Pages 462-462  
  Keywords Editorial; Electron microscopy for materials research (EMAT)  
  Abstract  
  Address  
  Corporate Author Thesis (up)  
  Publisher Place of Publication Editor  
  Language Wos 000480512600028 Publication Date 2019-08-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 2 Open Access  
  Notes ; ; Approved Most recent IF: NA  
  Call Number UA @ admin @ c:irua:161845 Serial 5389  
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Author Poppe, R.; Roth, N.; Neder, R.B.; Palatinus, L.; Iversen, B.B.; Hadermann, J. url  doi
openurl 
  Title Refining short-range order parameters from the three-dimensional diffuse scattering in single-crystal electron diffraction data Type A1 Journal article
  Year 2024 Publication IUCrJ Abbreviated Journal  
  Volume 11 Issue 1 Pages 82-91  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract Our study compares short-range order parameters refined from the diffuse scattering in single-crystal X-ray and single-crystal electron diffraction data. Nb0.84CoSb was chosen as a reference material. The correlations between neighbouring vacancies and the displacements of Sb and Co atoms were refined from the diffuse scattering using a Monte Carlo refinement in DISCUS. The difference between the Sb and Co displacements refined from the diffuse scattering and the Sb and Co displacements refined from the Bragg reflections in single-crystal X-ray diffraction data is 0.012 (7) angstrom for the refinement on diffuse scattering in single-crystal X-ray diffraction data and 0.03 (2) angstrom for the refinement on the diffuse scattering in single-crystal electron diffraction data. As electron diffraction requires much smaller crystals than X-ray diffraction, this opens up the possibility of refining short-range order parameters in many technologically relevant materials for which no crystals large enough for single-crystal X-ray diffraction are available.  
  Address  
  Corporate Author Thesis (up)  
  Publisher Place of Publication Editor  
  Language Wos 001168018300012 Publication Date 2023-12-14  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 2052-2525 ISBN Additional Links UA library record; WoS full record  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:205513 Serial 9170  
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