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Author | Lebedev, O.I.; Van Tendeloo, G.; Suvorova, A.A.; Usov, I.O.; Suvorov, A.V. | ||||
Title | HREM study of ion implantation in 6H-SiC at high temperatures | Type | A1 Journal article | ||
Year | 1997 | Publication | Journal of electron microscopy | Abbreviated Journal | Microscopy-Jpn |
Volume | 46 | Issue | 4 | Pages | 271-279 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
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Corporate Author | Thesis ![]() |
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Publisher | Place of Publication | Tokyo | Editor | ||
Language | Wos | A1997XY94900002 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0022-0744; 1477-9986 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 0.9 | Times cited | 7 | Open Access | |
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:21444 | Serial | 1511 | ||
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