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Author | Tan, H.; Turner, S.; Yucelen, E.; Verbeeck, J.; Van Tendeloo, G. | ||||
Title | 2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy : reply | Type | Editorial | ||
Year | 2012 | Publication | Physical review letters | Abbreviated Journal | Phys Rev Lett |
Volume | 108 | Issue | 25 | Pages | 259702 |
Keywords | Editorial; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000305568700038 | Publication Date | 2012-06-19 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume ![]() |
Series Issue | Edition | |||
ISSN | 0031-9007 | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 8.462 | Times cited | Open Access | ||
Notes | Approved | Most recent IF: 8.462; 2012 IF: 7.943 | |||
Call Number | UA @ admin @ c:irua:100293 | Serial | 5370 | ||
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