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Author Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D.
Title Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range Type A1 Journal article
Year 2006 Publication Physical review letters Abbreviated Journal Phys Rev Lett
Volume 96 Issue 9 Pages 096106,1-4
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy. The electron exit wave, which is closely related to the projected crystal potential, is reconstructed and used as a starting point for statistical parameter estimation. This method allows us to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range. Using this method one is no longer restricted to the information limit of the electron microscope. Our results are in good agreement with x-ray powder diffraction data demonstrating the reliability of the method. Moreover, it will be shown that local effects can be interpreted using this approach.
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Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000235905700042 Publication Date 2006-03-10
Series Editor Series Title Abbreviated Series Title
Series Volume (down) Series Issue Edition
ISSN 0031-9007;1079-7114; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 8.462 Times cited 69 Open Access
Notes Fwo; Iap V Approved Most recent IF: 8.462; 2006 IF: 7.072
Call Number UA @ lucian @ c:irua:56977 Serial 3154
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