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Author | de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. | ||||
Title | Statistical parameter estimation theory : principles and simulation studies | Type | H2 Book chapter | ||
Year | 2021 | Publication | Advances in imaging and electron physics T2 – Advances in imaging and electron physics | Abbreviated Journal | |
Volume | Issue | Pages | 29-72 | ||
Keywords | H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | In this chapter, the principles of statistical parameter estimation theory for a quantitative analysis of atomic-resolution electron microscopy images are introduced. Within this framework, electron microscopy images are described by a parametric statistical model. Here, parametric models are introduced for different types of electron microscopy images: reconstructed exit waves, annular dark-field (ADF) scanning transmission electron microscopy (STEM) images, and simultaneously acquired ADF and annular bright-field (ABF) STEM images. Furthermore, the Cramér-Rao lower bound (CRLB) is introduced, i.e. a theoretical lower bound on the variance of any unbiased estimator. This CRLB is used to quantify the precision of the structure parameters of interest, such as the atomic column positions and the integrated atomic column intensities. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | 2021-03-06 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | 217 | Series Issue | Edition | ||
ISSN | ISBN | 978-0-12-824607-8; 1076-5670 | Additional Links | UA library record | |
Impact Factor | Times cited | Open Access | Not_Open_Access | ||
Notes | ERC Consolidator project funded by the European Union grant #770887 Picometrics | Approved | Most recent IF: NA | ||
Call Number | UA @ admin @ c:irua:177527 | Serial | 6788 | ||
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