Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Nikolaev, A.V.; Prassides, K.; Michel, K.H. |
Charge transfer and polymer phases in AC60 (A=K, Rb, Cs) fullerides |
1998 |
The journal of chemical physics |
108 |
14 |
UA library record; WoS full record; WoS citing articles |
Riva, C.; Escorcia, R.A.; Govorov, A.O.; Peeters, F.M. |
Charged donors in quantum dots: finite difference and fractional dimensions results |
2004 |
Physical review : B : condensed matter and materials physics |
69 |
23 |
UA library record; WoS full record; WoS citing articles |
Koenraad, P.M.; Shi, J.M.; van de Stadt, A.F.W.; Smets, A.; Perenboom, J.A.A.J.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in a δ-doped quantum barrier |
1996 |
|
|
|
UA library record |
Shi, J.M.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in Si ?-doped GaAs |
1996 |
|
|
|
UA library record |
Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. |
Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy |
2001 |
Materials science in semiconductor processing |
4 |
|
UA library record; WoS full record |
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
|
|
|
UA library record; WoS full record; |
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. |
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM |
2001 |
Physica: B : condensed matter
T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY |
308 |
3 |
UA library record; WoS full record; WoS citing articles |
Struyf, H.; van Vaeck, L.; Kennis, P.; Gijbels, R.; van Grieken, R. |
Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
11 |
UA library record; WoS full record; WoS citing articles |
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
|
|
|
UA library record |
Borgatti, F.; Park, C.; Herpers, A.; Offi, F.; Egoavil, R.; Yamashita, Y.; Yang, A.; Kobata, M.; Kobayashi, K.; Verbeeck, J.; Panaccione, G.; Dittmann, R.; |
Chemical insight into electroforming of resistive switching manganite heterostructures |
2013 |
Nanoscale |
5 |
40 |
UA library record; WoS full record; WoS citing articles |
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
Obradors, X.; Puig, T.; Pomar, A.; Sandiumenge, F.; Piñol, S.; Mestres, N.; Castaño, O.; Coll, M.; Cavallaro, A.; Palau, A.; Gázquez, J.; González, J.C.; Gutiérrez, J.; Romá, N.; Ricart, S.; Moretó, J.M.; Rossell, M.D.; Van Tendeloo, G. |
Chemical solution deposition: a path towards low cost coated conductors |
2004 |
Superconductor science and technology |
17 |
107 |
UA library record; WoS full record; WoS citing articles |
Vernochet, C.; Vannier, R.-N.; Huvé, M.; Pirovano, C.; Nowogrocki, G.; Mairesse, G.; Van Tendeloo, G. |
Chemical, structural and electrical characterizations in the BIZNVOX family |
2000 |
Journal of materials chemistry |
10 |
13 |
UA library record; WoS full record; WoS citing articles |
Stambula, S.; Gauquelin, N.; Bugnet, M.; Gorantla, S.; Turner, S.; Sun, S.; Liu, J.; Zhang, G.; Sun, X.; Botton, G.A. |
Chemical structure of nitrogen-doped graphene with single platinum atoms and atomic clusters as a platform for the PEMFC electrode |
2014 |
The journal of physical chemistry: C : nanomaterials and interfaces |
118 |
57 |
UA library record; WoS full record; WoS citing articles |
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
|
|
UA library record |
Tikhomirov, A.S.; Sorokina, N.E.; Shornikova, O.N.; Morozov, V.A.; Van Tendeloo, G.; Avdeev, V.V. |
The chemical vapor infiltration of exfoliated graphite to produce carbon/carbon composites |
2011 |
Carbon |
49 |
7 |
UA library record; WoS full record; WoS citing articles |
Abakumov, A.M.; Hadermann, J.; Van Tendeloo, G.; Antipov, E.V. |
Chemistry and structure of anion-deficient perovskites with translational interfaces |
2008 |
Journal of the American Ceramic Society |
91 |
39 |
UA library record; WoS full record; WoS citing articles |
Li, Y.; Yang, X.-Y.; Tian, G.; Vantomme, A.; Yu, J.; Van Tendeloo, G.; Su, B.-L. |
Chemistry of trimethyl aluminum: a spontaneous route to thermally stable 3D crystalline macroporous alumina foams with a hierarchy of pore sizes |
2010 |
Chemistry of materials |
22 |
38 |
UA library record; WoS full record; WoS citing articles |
Grujić, M.M.; Tadic, M.Z.; Peeters, F.M. |
Chiral properties of topological-state loops |
2015 |
Physical review : B : condensed matter and materials physics |
91 |
6 |
UA library record; WoS full record; WoS citing articles |
Zarenia, M.; Pereira, J.M.; Farias, G.A.; Peeters, F.M. |
Chiral states in bilayer graphene : magnetic field dependence and gap opening |
2011 |
Physical review : B : condensed matter and materials physics |
84 |
50 |
UA library record; WoS full record; WoS citing articles |
Bernaerts, D.; op de Beeck, M.; Amelinckx, S.; van Landuyt, J.; Van Tendeloo, G. |
The chirality of carbon nanotubules determined by dark-field electron microscopy |
1996 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
74 |
20 |
UA library record; WoS full record; WoS citing articles |
Liu, Y.; Brelet, Y.; He, Z.; Yu, L.; Mitryukovskiy, S.; Houard, A.; Forestier, B.; Couairon, A.; Mysyrowicz, A. |
Ciliary white light : optical aspect of ultrashort laser ablation on transparent dielectrics |
2013 |
Physical review letters |
110 |
10 |
UA library record; WoS full record; WoS citing articles |
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J. |
Circular dichroism in the electron microscope: progress and applications (invited) |
2010 |
Journal of applied physics |
107 |
28 |
UA library record; WoS full record; WoS citing articles |
Partoens, B.; Peeters, F.M. |
Classical artificial two-dimensional atoms: the Thomson model |
1997 |
Journal of physics : condensed matter |
9 |
52 |
UA library record; WoS full record; WoS citing articles |
Peeters, F.M.; Partoens, B.; Schweigert, V.A.; Schweigert, I.V. |
Classical atomic bilayers |
1998 |
|
|
|
UA library record; WoS full record; |
Partoens, B.; Schweigert, V.A.; Peeters, F.M. |
Classical double-layer atoms: artificial molecules |
1997 |
Physical review letters |
79 |
49 |
UA library record; WoS full record; WoS citing articles |
Peeters, F.M.; Partoens, B.; Kong, M. |
The classical electron gas in artificial structures |
2004 |
|
|
|
UA library record |
Baumgartner, A.; Ihn, T.; Ensslin, K.; Papp, G.; Peeters, F.; Maranowski, K.; Gossard, A.C.; |
Classical hall effect in scanning gate experiments |
2006 |
Physical review : B : condensed matter and materials physics |
74 |
20 |
UA library record; WoS full record; WoS citing articles |
Cândido, L.; Rino, J.-P.; Studart, N.; Peeters, F.M. |
Classical model of clusters of screened charges in quantum dots |
1997 |
Brazilian journal of physics |
27 |
|
UA library record |