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Author |
Turner, S.; Lazar, S.; Freitag, B.; Egoavil, R.; Verbeeck, J.; Put, S.; Strauven, Y.; Van Tendeloo, G. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
High resolution mapping of surface reduction in ceria nanoparticles |
Type |
A1 Journal article |
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Year |
2011 |
Publication |
Nanoscale |
Abbreviated Journal |
Nanoscale |
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Volume |
3 |
Issue |
8 |
Pages |
3385-3390 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Surface reduction of ceria nano octahedra with predominant {111} and {100} type surfaces is studied using a combination of aberration-corrected Transmission Electron Microscopy (TEM) and spatially resolved electron energy-loss spectroscopy (EELS) at high energy resolution and atomic spatial resolution. The valency of cerium ions at the surface of the nanoparticles is mapped using the fine structure of the Ce M4,5 edge as a fingerprint. The valency of the surface cerium ions is found to change from 4+ to 3+ owing to oxygen deficiency (vacancies) close to the surface. The thickness of this Ce3+ shell is measured using atomic-resolution Scanning Transmission Electron Microscopy (STEM)-EELS mapping over a {111} surface (the predominant facet for this ceria morphology), {111} type surface island steps and {100} terminating planes. For the {111} facets and for {111} surface islands, the reduction shell is found to extend over a single fully reduced surface plane and 12 underlying mixed valency planes. For the {100} facets the reduction shell extends over a larger area of 56 oxygen vacancy-rich planes. This finding provides a plausible explanation for the higher catalytic activity of the {100} surface facets in ceria. |
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Corporate Author |
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Publisher |
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Place of Publication |
Cambridge |
Editor |
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Wos |
000293521700057 |
Publication Date |
2011-06-30 |
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Series Title ![sorted by Series Title field, ascending order (up)](img/sort_asc.gif) |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
2040-3364;2040-3372; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
7.367 |
Times cited |
127 |
Open Access |
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Notes |
Fwo |
Approved |
Most recent IF: 7.367; 2011 IF: 5.914 |
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Call Number |
UA @ lucian @ c:irua:90361UA @ admin @ c:irua:90361 |
Serial |
1458 |
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Permanent link to this record |
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Author |
Radvanyi, E.; Van Havenbergh, K.; Porcher, W.; Jouanneau, S.; Bridel, J.-S.; Put, S.; Franger, S. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
Study and modeling of the Solid Electrolyte Interphase behavior on nano-silicon anodes by Electrochemical Impedance Spectroscopy |
Type |
A1 Journal article |
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Year |
2014 |
Publication |
Electrochimica acta |
Abbreviated Journal |
Electrochim Acta |
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Volume |
137 |
Issue |
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Pages |
751-757 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
The instability of the Solid Electrolyte Interphase (SEI) at the surface of nano-silicon electrodes has been recognized as one of the key issues to explain the rapid capacity fading of theses electrodes. In this paper, two distinct Si-based systems are studied by using Electrochemical Impedance Spectroscopy (EIS). First, several EIS spectra are recorded along the second electrochemical cycle. Although the active material, the electrode formulation, and the experimental conditions are different for the two systems, the same phenomena are observed in both cases: (i) the SEI deposit around 50 kHz, (ii) the charge transfer (CT) with a characteristic frequency varying from 300 to 1 500 Hz, and (iii) an inductive loop at ∼1 Hz which appears only when the potential of the electrode is below 0.35 V vs Li. As the latter has never been reported for Si-based electrodes, the second step of the work consists in understanding this phenomenon. Thanks to the results obtained in a set of several complementary experiments, we finally attribute the inductive loop to the constant formation/deposition of SEI products, in competition with the CT process. In addition, we propose a mechanism for this specific phenomenon and the equivalent circuit to fit the recorded EIS spectra. |
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Place of Publication |
London |
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Wos |
000341462500095 |
Publication Date |
2014-06-19 |
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Series Editor |
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Series Title ![sorted by Series Title field, ascending order (up)](img/sort_asc.gif) |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0013-4686; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
4.798 |
Times cited |
36 |
Open Access |
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Notes |
IWT (K. Van Havenbergh) |
Approved |
Most recent IF: 4.798; 2014 IF: 4.504 |
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Call Number |
UA @ lucian @ c:irua:117945 |
Serial |
3323 |
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Permanent link to this record |