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Author | Markowicz, A.A.; Van Grieken, R.E. | ||||
Title | Quantification in XRF analysis of intermediate-thickness samples | Type | H3 Book chapter | ||
Year | 2002 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 407-431 T2 - Handbook of X-ray spectrometry / Grie | ||
Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | |||
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Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ admin @ c:irua:36389 | Serial | 8433 | ||
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