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Author | Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Verschoren, G.; Lievens, P.; Hou, M.; van Swygenhoven, H. | ||||
Title | Atomic scale characterization of supported and assembled nanoparticles | Type | P3 Proceeding | ||
Year | 2001 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | B8.3,1-6 | ||
Keywords | P3 Proceeding; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | s.l. | Editor | ||
Language | Wos | Publication Date | 0000-00-00 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:48390 | Serial | 181 | ||
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