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Author |
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. |
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Title |
Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction |
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A3 Journal article |
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Year |
2005 |
Publication |
Microscopy and microanalysis |
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11 |
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Pages |
556-557 |
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Keywords |
A3 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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0000-00-00 |
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Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:54881 |
Serial |
3155 |
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Author |
Avila-Brande, D.; Otero-Díaz, L.C.; Landa-Cánovas, A.R.; Bals, S.; Van Tendeloo, G. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
A new Bi4Mn1/3W2/3O8Cl Sillén-Aurivillius intergrowth: synthesis and structural characterisation by quantitative transmission electron microscopy |
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A1 Journal article |
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Year |
2006 |
Publication |
European journal of inorganic chemistry |
Abbreviated Journal |
Eur J Inorg Chem |
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Issue |
9 |
Pages |
1853-1858 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
The synthesis and structural characterisation of a new phase with nominal composition Bi4Mn1/3W2/3O8Cl is presented. Conventional and analytical transmission electron microscopy are used to determine the composition, unit-cell symmetry and space group of the compound, whereas a structural model is deducted by exit-wave reconstruction in the transmission electron microscope. This technique allows the microscope information limit of 1.1 angstrom to be reached and the (light) oxygen atoms in the presence of heavier atoms (Bi, W, Mn) to be imaged. The average structure is refined from Xray powder diffraction data using the Rietveld method yielding an orthorhombic unit cell with lattice parameters a 5.467(4) angstrom, b = 5.466(7) angstrom and c = 14.159(3) angstrom and space group Cm2m, which could be described as a Sillen-Aurivillius intergrowth. ((c) Wiley-VCH Verlag GmbH & Co. KGaA, 69451 Weinheim, Germany, 2006) |
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Place of Publication |
Weinheim |
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000237617800016 |
Publication Date |
2006-03-13 |
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1434-1948;1099-0682; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.444 |
Times cited |
12 |
Open Access |
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Approved |
Most recent IF: 2.444; 2006 IF: 2.704 |
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Call Number |
UA @ lucian @ c:irua:59436 |
Serial |
2335 |
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Permanent link to this record |
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Author |
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range |
Type |
A1 Journal article |
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Year |
2006 |
Publication |
Physical review letters |
Abbreviated Journal |
Phys Rev Lett |
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Volume |
96 |
Issue |
9 |
Pages |
096106,1-4 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy. The electron exit wave, which is closely related to the projected crystal potential, is reconstructed and used as a starting point for statistical parameter estimation. This method allows us to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range. Using this method one is no longer restricted to the information limit of the electron microscope. Our results are in good agreement with x-ray powder diffraction data demonstrating the reliability of the method. Moreover, it will be shown that local effects can be interpreted using this approach. |
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Place of Publication |
New York, N.Y. |
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000235905700042 |
Publication Date |
2006-03-10 |
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ISSN |
0031-9007;1079-7114; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
8.462 |
Times cited |
69 |
Open Access |
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Notes |
Fwo; Iap V |
Approved |
Most recent IF: 8.462; 2006 IF: 7.072 |
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Call Number |
UA @ lucian @ c:irua:56977 |
Serial |
3154 |
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Permanent link to this record |