Number of records found: 335
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Citations
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Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis”. Oleshko V, Kindratenko V, Gijbels R, van Espen P, Jacob W, Mikrochimica acta: supplementum 13, 443 (1996)
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Study of the Ar metastable atom population in a hollow cathode discharge by means of a hybrid model and spectrometric measurements”. Baguer N, Bogaerts A, Donko Z, Gijbels R, Sadeghi N, Journal of applied physics 97, 123305 (2005). http://doi.org/10.1063/1.1929857
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Sulfur species and associated trace elements in south-west Bulgarian thermal waters”. Veldeman E, Van 't dack L, Gijbels R, Pentcheva E, Applied geochemistry 6, 49 (1991)
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Sur l'équilibre hydrogéochimique “solution –, suspension&rdquo, dans les systèmes hydrothermaux du socle cristallin”. Pentcheva EN, Veldeman E, Van 't dack L, Gijbels R, Doklady Bolgarskoi Akademii Nauk 49, 65 (1996)
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Sur les processus, controlant le caractère hydrochimique des eaux thermales profondes (Bulgarie Méridionale)”. Pentcheva E, Veldeman E, Van 't dack L, Gijbels R, Comptes rendus de l'Académie bulgare des sciences 44, 51 (1991)
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, Journal of analytical atomic spectrometry 14, 429 (1999). http://doi.org/10.1039/a807276k
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R Antwerp, page 528 (1998).
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Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Brox O, Benninghoven A, Geuens I, de Keyzer R, (1997)
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Systematic errors in 14-MeV neutron activation analysis for oxygen : part 1 : neutron and γ-ray attenuation effects”. Vandecasteele C, van Grieken R, Gijbels R, Speecke A, Analytica chimica acta 64, 187 (1973). http://doi.org/10.1016/S0003-2670(01)82436-3
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Systematic errors in 14-MeV neutron activation analysis for oxygen : part 2 : a general standardization method for the determination of oxygen”. Vandecasteele C, van Grieken R, Gijbels R, Speecke A, Analytica chimica acta 65, 1 (1973). http://doi.org/10.1016/S0003-2670(01)80158-6
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A temperature study of mixed AgBr-AgBrI tabular crystals”. Goessens C, Schryvers D, van Landuyt J, Geuens I, Gijbels R, Jacob W, de Keyzer R Hawaii, page 70 (1995).
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A temperature study of mixed AgBr-AgBrI tabular crystals”. Goessens C, Schryvers D, van Landuyt J, Geuens I, Gijbels R, Jacob W, de Keyzer R, , 36 (1992)
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The anharmonic-force field of thioformaldehyde, h2cs, by ab-initio methods”. Martin JML, Francois, Gijbels R, Journal of molecular spectroscopy 168, 363 (1994). http://doi.org/10.1006/jmsp.1994.1285
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The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS)”. Lenaerts J, Verlinden G, Gijbels R, Geuens I, Callant P, , 180 (2000)
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Three-dimensional density profiles of sputtered atoms and ions in a direct current glow discharge: experimental study and comparison with calculations”. Bogaerts A, Wagner E, Smith BW, Winefordner JD, Pollmann D, Harrison WW, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 52, 205 (1997)
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Three-dimensional density profiles of the argon metastable atoms in a direct current glow discharge: experimental study and comparison with calculations”. Bogaerts A, Guenard RD, Smith BW, Winefordner JD, Harrison WW, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 52, 219 (1997)
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Three-dimensional modeling of a direct current glow discharge in argon: is it better than one-dimensional modeling?”.Bogaerts A, Gijbels R, Fresenius' journal of analytical chemistry 359, 331 (1997). http://doi.org/10.1007/s002160050582
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TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates”. Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, , 115 (2000)
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Trace element and micro-mineral composition of some selected anhydrite samples from the Saint Ghislain drill hole (Hainaut, Belgium)”. Vandelannoote R, Van 't dack L, Gijbels R, Bulletin van de Belgische Vereniging voor Geologie 95, 101 (1986)
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Trace element geochemistry in thermal waters from Amélie-les-Bains (Eastern Pyrenees, France)”. Gijbels R, van Grieken R, Vandelannoote R, Blommaert W, Van 't dack L, , 123 (1980)
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Trace element geochemistry in thermal waters from Plombières and Bains (Vosges)”. Gijbels R, van Grieken R, Blommaert W, Vandelannoote R, Van 't dack L, , 396 (1980)
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Gijbels R, van Grieken R (1985) Trace element geochemistry in thermal waters from the Eastern Pyrenees. S.l
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Trace element geochemistry of the system rock-thermal water –, suspended matter –, deposits in a granitic environment”. Pentcheva EN, Veldeman E, Van 't dack L, Gijbels R, , 1321 (1992)
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Trace-element geochemistry of thermal water percolating through a karstic environment in the region of Saint Ghislain (Belgium)”. Blommaert W, Vandelannoote R, Sadurski A, Van 't dack L, Gijbels R, Journal of volcanology and geothermal research 19, 331 (1983). http://doi.org/10.1016/0377-0273(83)90117-8
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Trace-elemental anomalies in surface water near a small lead-zinc mineralization at Menez-Albot (Brittany, France)”. Vandelannoote R, Blommaert W, Sadurski A, Van 'T Dack L, Gijbels R, Van Grieken R, Bosch B, Leleu M, Rochon J, Sarcia C, Sureau JF;, Journal of geochemical exploration 20, 33 (1984). http://doi.org/10.1016/0375-6742(84)90088-8
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Two-dimensional model of a direct current glow discharge : description of the argon metastable atoms, sputtered atoms and ions”. Bogaerts A, Gijbels R, Analytical chemistry 68, 2676 (1996). http://doi.org/10.1021/ac951206z
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Two-dimensional model of a direct current glow discharge: description of the electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer WJ, Analytical chemistry 68, 2296 (1996). http://doi.org/10.1021/ac9510651
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Unveiling the composition of sulphur sensitization specks by their interactions with TAI”. Charlier E, van Doorselaer M, Gijbels R, de Keyzer R, Geuens I, Journal Of Imaging Science And Technology 44, 235 (2000)
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The use of surface analysis techniques and isotope mass spectrometry for the study of water-rock interactions of interest in hot-dry rock technology”. Adriaens A, van Nevel L, Van 't dack L, de Bièvre P, Adams F, Gijbels R, , 2541 (1995)
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XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers”. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films 343/344, 583 (1999). http://doi.org/10.1016/S0040-6090(99)00122-4
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