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Three-dimensional atomic imaging of colloidal core-shell nanocrystals”. Bals S, Casavola M, van Huis MA, Van Aert S, Batenburg KJ, Van Tendeloo G, Vanmaekelbergh D, Nano letters 11, 3420 (2011). http://doi.org/10.1021/nl201826e
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Three-dimensional atomic imaging of crystalline nanoparticles”. Van Aert S, Batenburg KJ, Rossell MD, Erni R, Van Tendeloo G, Nature 470, 374 (2011). http://doi.org/10.1038/nature09741
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Three-dimensional characterization of helical silver nanochains mediated by protein assemblies”. Leroux F, Gysemans M, Bals S, Batenburg KJ, Snauwaert J, Verbiest T, van Haesendonck C, Van Tendeloo G, Advanced materials 22, 2193 (2010). http://doi.org/10.1002/adma.200903657
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Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped SiO2”. Gontard LC, Jinschek JR, Ou H, Verbeeck J, Dunin-Borkowski RE, Applied physics letters 100, 263113 (2012). http://doi.org/10.1063/1.4731765
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Three-dimensional reconstruction of a nanoparticle at atomic resolution”. Batenburg J, Van Aert S, ERCIM news 86, 52 (2011)
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Throughput maximization of particle radius measurements by balancing size and current of the electron probe”. van den Broek W, Van Aert S, Goos P, van Dyck D, Ultramicroscopy 111, 940 (2011). http://doi.org/10.1016/j.ultramic.2010.11.025
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Tiling silicalite-1 nanoslabs into 3D mosaics”. Kremer SPB, Kirschhock CEA, Aerts A, Villani K, Martens JA, Lebedev OI, Van Tendeloo G, Advanced materials 15, 1705 (2003). http://doi.org/10.1002/adma.200305266
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Titanosilicate beads with hierarchical porosity : synthesis and application as epoxidation catalysts”. Lin K, Lebedev OI, Van Tendeloo G, Jacobs PA, Pescarmona PP, Chemistry: a European journal 16, 13509 (2011). http://doi.org/10.1002/chem.201001508
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Tomographic spectroscopic imaging, an experimental proof of concept”. van den Broek W, Verbeeck J, Schryvers D, de Backer S, Scheunders P, Ultramicroscopy 109, 296 (2009). http://doi.org/10.1016/j.ultramic.2008.11.022
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Tomography using annular dark field imaging in TEM”. Bals S, Kisielowski C, Croitoru M, Van Tendeloo G, Microscopy and microanalysis 11, 2118 (2005)
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Topological surface state enhanced photothermoelectric effect in Bi2Se3 nanoribbons”. Yan Y, Liao ZM, Ke X, Van Tendeloo G, Wang Q, Sun D, Yao W, Zhou S, Zhang L, Wu HC, Yu DP;, Nano letters 14, 4389 (2014). http://doi.org/10.1021/nl501276e
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Topotactic oxidative and reductive control of the structures and properties of layered manganese oxychalcogenides”. Hyett G, Barrier N, Clarke SJ, Hadermann J, Journal of the American Chemical Society 129, 11192 (2007). http://doi.org/10.1021/ja073048m
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Topotactic reduction as a route to new close-packed anion deficient perovskites: structure and magnetism of 4H-BaMnO2+x”. Hadermann J, Abakumov AM, Adkin JJ, Hayward MA, Journal of the American Chemical Society 131, 10598 (2009). http://doi.org/10.1021/ja903216d
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Topotactic transformation of the cationic conductor Li4Mo5O17 into a rock salt type oxide Li12Mo5O17”. Pop N, Pralong V, Caignaert V, Colin JF, Malo S, Van Tendeloo G, Raveau B, Chemistry of materials 21, 3242 (2009). http://doi.org/10.1021/cm900767m
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Towards atomic resolution in sodium titanate nanotubes using near-edge X-ray-absorption fine-structure spectromicroscopy combined with multichannel multiple-scattering calculations”. Bittencourt C, Krüger P, Lagos MJ, Ke X, Van Tendeloo G, Ewels C, Umek P, Guttmann P, Beilstein journal of nanotechnology 3, 789 (2012). http://doi.org/10.3762/bjnano.3.88
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Towards Novel Multifunctional Pillared Nanostructures: Effective Intercalation of Adamantylamine in Graphene Oxide and Smectite Clays”. Spyrou K, Potsi G, Diamanti EK, Ke X, Serestatidou E, Verginadis II, Velalopoulou AP, Evangelou AM, Deligiannakis Y, Van Tendeloo G, Gournis D, Rudolf P;, Advanced functional materials 24, 5841 (2014). http://doi.org/10.1002/adfm.201400975
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Towards quantitative high resolution electron microscopy?”.Van Tendeloo G, op de Beeck M, De Meulenaere P, van Dyck D, Institute of physics conference series 147, 67 (1995)
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Transmission electron microscopic study of the defect structure in Sr4Fe6O12+\delta compounds with variable oxygen content”. Rossell MD, Abakumov AM, Van Tendeloo G, Lomakov MV, Istomin SY, Antipov EV, Chemistry and materials 17, 4717 (2005). http://doi.org/10.1021/cm050777x
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Transmission electron microscopy and electron energy-loss spectroscopy analysis of manganese oxide nanowires”. Du GH, Yuan ZY, Van Tendeloo G, Applied physics letters 86 (2005). http://doi.org/10.1063/1.1861963
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Transmission electron microscopy and Monte Carlo simulations of ordering in Au-Cu clusters produced in a laser vaporization source”. Pauwels B, Van Tendeloo G, Zhurkin E, Hou M, Verschoren G, Kuhn LT, Bouwen W, Lievens P, Physical review : B : condensed matter and materials physics 63, 165406 (2001). http://doi.org/10.1103/PhysRevB.63.165406
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Transmission electron microscopy and structural phase transitions in anion-deficient perovskite-based oxides”. Hadermann J, Van Tendeloo G, Abakumov AM, Acta crystallographica: section A: foundations of crystallography 61, 77 (2005). http://doi.org/10.1107/S0108767304023013
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M, Springer proceedings in physics 107, 389 (2005)
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Transmission electron microscopy investigation of Bi-2223/Ag tapes”. Gottschalck Andersen L, Bals S, Van Tendeloo G, Poulsen HF, Liu YL, Physica: C : superconductivity 353, 251 (2001). http://doi.org/10.1016/S0921-4534(00)01755-X
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Transmission electron microscopy investigation of dislocation slip during superelastic cycling of NiTi wires”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, International journal of plasticity 27, 282 (2011). http://doi.org/10.1016/j.ijplas.2010.05.005
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Transmission electron microscopy investigation of microstructures in low-hysteresis alloys with special lattice parameters”. Delville R, Schryvers D, Zhang Z, James RD, Scripta materialia 60, 293 (2009). http://doi.org/10.1016/j.scriptamat.2008.10.025
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Transmission electron microscopy of NdNiO3 thin films on silicon substrates”. Laffez P, Retoux R, Boullay P, Zaghrioui M, Lacorre P, Van Tendeloo G, European physical journal: applied physics 12, 55 (2000). http://doi.org/10.1051/epjap:2000171
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Transmission electron microscopy on interface engineered superconducting thin films”. Bals S, Van Tendeloo G, Rijnders G, Huijben M, Leca V, Blank DHA, IEEE transactions on applied superconductivity 13, 2834 (2003). http://doi.org/10.1109/TASC.2003.812023
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Transmission electron microscopy studies of (111) twinned silver halide microcrystals”. Goessens C, Schryvers D, van Landuyt J, Microscopy research and technique 42, 85 (1998). http://doi.org/10.1002/(SICI)1097-0029(19980715)42:2<85::AID-JEMT3>3.0.CO;2-M
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Transmission electron microscopy study of combined precipitation of Ti2Ni(Pd) and Ti2Pd(Ni) in a Ti50Ni30Pd20 alloy”. Delville R, Schryvers D, Intermetallics 18, 2353 (2010). http://doi.org/10.1016/j.intermet.2010.08.006
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A transmission electron-microscopy study of crystalline surface domains on al-co decagonal quasi-crystals and the \tau2-Al13CO4 approximant”. Zhang Z, Ma LN, Liao XZ, van Landuyt J, Philosophical magazine letters 70, 303 (1994). http://doi.org/10.1080/09500839408240991
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