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Author | Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. | ||||
Title | Imaging TOF-SIMS for the surface analysis of silver halide microcrystals | Type | A1 Journal article | ||
Year | 2003 | Publication | Applied surface science | Abbreviated Journal | Appl Surf Sci |
Volume | 203/204 | Issue | Pages | 614-619 | |
Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000180527300138 | Publication Date | 2002-12-30 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0169-4332; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 3.387 | Times cited | 7 | Open Access | |
Notes | Approved | Most recent IF: 3.387; 2003 IF: 1.284 | |||
Call Number | UA @ lucian @ c:irua:51974 | Serial | 1556 | ||
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