| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. | ||||
| Title | High-resolution electron microscopy : from imaging toward measuring | Type | A1 Journal article | ||
| Year | 2002 | Publication | IEEE transactions on instrumentation and measurement | Abbreviated Journal | Ieee T Instrum Meas |
| Volume | 51 | Issue | 4 | Pages | 611-615 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000178992000010 | Publication Date | 2003-01-03 | |
Series Editor  |
Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0018-9456; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.456 | Times cited | 13 | Open Access | |
| Notes | Approved | Most recent IF: 2.456; 2002 IF: 0.592 | |||
| Call Number | UA @ lucian @ c:irua:47521 | Serial | 1450 | ||
| Permanent link to this record | |||||