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Author Title Year Publication Volume Times cited Additional Links
Aghaei, M. Computational study of inductively coupled plasma mass spectroscopy (ICP-MS) 2014 UA library record
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy 1994 UA library record; WoS full record;
Carrillo Nuñez, H. Combining the modified local density approach with variational calculus : a flexible tandem for studying electron transport in nano-devices 2012 UA library record
Eckert, M. Combined molecular dynamics and Monte Carlo simulations for the deposition of (ultra)nanocrystalline diamond 2010 UA library record
Oleshko, V.P.; Gijbels, R.; Jacob, W. Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques 1996 UA library record
Bogaerts, A.; Janssens, K.; van Grieken, R. Colloquium Spectroscopicum Internationale 34 (CSI 34), Antwerp, Belgium, 4-9 September 2005 2006 UA library record
Janssens, K.; Bogaerts, A.; van Grieken, R. Colloquium Spectroscopicum Internationale 34: a collection of papers presented at the Colloquium Spectroscopicum Internationale, Antwerp, Belgium, 4-9 September 2005 2006 UA library record
van Dijk, J.; Kroesen, G.M.W.; Bogaerts, A. Cluster issue on plasma modelling 2009 UA library record
Peeters, F.M.; Partoens, B.; Kong, M. The classical electron gas in artificial structures 2004 UA library record
Peeters, F.M.; Partoens, B.; Schweigert, V.A.; Schweigert, I.V. Classical atomic bilayers 1998 UA library record; WoS full record;
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling 2000 UA library record
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. The chemical characterization of silver halide microcrystals 1993 UA library record
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy 2002 UA library record; WoS full record;
Shi, J.M.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. Charged-impurity correlations in Si ?-doped GaAs 1996 UA library record
Koenraad, P.M.; Shi, J.M.; van de Stadt, A.F.W.; Smets, A.; Perenboom, J.A.A.J.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. Charged-impurity correlations in a δ-doped quantum barrier 1996 UA library record
Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties 2000 UA library record
van Landuyt, J.; Van Tendeloo, G. Charcaterization by high-resolution transmission electron microscopy 1998 UA library record; WoS full record;
Leroux, F. Characterization of soft-hard matter composite materials by advanced transmission electron microscopy 2012 UA library record
Wiktor, C. Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy 2014 UA library record
Kirilenko, D. Characterization of graphene by electron diffraction 2012 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
d' Hondt, H. Characterization of anion deficient perovskites 2011 UA library record
Komendová, L. Characteristic length scales and vortex interactions in two-component superconducting systems 2013 UA library record
Van Tendeloo, G.; De Meulenaere, P.; Hervieu, M.; Letouze, F.; Martin, C. Cation ordering in Tl- and Hg-based superconducting materials 1996 UA library record
Biró, L.P.; Khanh, N.Q.; Horváth, Z.E.; Vértesy, Z.; Kocsonya, A.; Konya, Z.; Osváth, Z.; Koós, A.; Guylai, J.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B. Catalyst traces after chemical purification in CVD grown carbon nanotubes 2001 UA library record; WoS full record; WoS citing articles
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution 1999 UA library record; WoS full record;
Marmorkos, I.K.; Schweigert, V.A.; Peeters, F.M.; Lok, J.G.S. Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices 1996 UA library record
Yusupov, M. Atomic scale simulations for a better insight in plasma medicine 2014 UA library record
Zhurkin, E.; Hou, M.; van Swygenhoven, H.; Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Lievens, P.; Verschoren, G.; Kuriplach, J.; van Peteghem, S.; Segers, D.; Dauwe, C. Atomic scale modeling of supported and assembled nanoparticles 2001 UA library record
Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Verschoren, G.; Lievens, P.; Hou, M.; van Swygenhoven, H. Atomic scale characterization of supported and assembled nanoparticles 2001 UA library record