“Nanoscale Characterization of Growth of Secondary Phases in Off-Stoichiometric CZTS Thin Films”. Vishwakarma M, Karakulina OM, Abakumov AM, Hadermann J, Mehta BR, Journal of nanoscience and nanotechnology 18, 1688 (2018). http://doi.org/10.1166/jnn.2018.14261
Abstract: The presence of secondary phases is one of the main issues that hinder the growth of pure kesterite Cu2ZnSnS4 (CZTS) based thin films with suitable electronic and junction properties for efficient solar cell devices. In this work, CZTS thin films with varied Zn and Sn content have been prepared by RF-power controlled co-sputtering deposition using Cu, ZnS and SnS targets and a subsequent sulphurization step. Detailed TEM investigations show that the film shows a layered structure with the majority of the top layer being the kesterite phase. Depending on the initial thin film composition, either about ~1 μm Cu-rich and Zn-poor kesterite or stoichiometric CZTS is formed as top layer. X-ray diffraction, Raman spectroscopy and transmission electron microscopy reveal the presence of Cu2−x S, ZnS and SnO2 minor secondary phases in the form of nanoinclusions or nanoparticles or intermediate layers.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 1.483
DOI: 10.1166/jnn.2018.14261
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“Synthesis and structural characterization of a novel Sillén &ndash, Aurivillius bismuth oxyhalide, PbBi3VO7.5Cl, and its derivatives”. Charkin DO, Plokhikh IV, Kazakov SM, Kalmykov SN, Akinfiev VS, Gorbachev AV, Batuk M, Abakumov AM, Teterin YA, Maslakov KI, Teterin AY, Ivanov KE, Solid state sciences 75, 27 (2018). http://doi.org/10.1016/j.solidstatesciences.2017.11.006
Abstract: A new Sillen – Aurivillius family of layered bismuth oxyhalides has been designed and successfully constructed on the basis of PbBiO2X(X = halogen) synthetic perites and g-form of Bi2VO5.5 solid elec- trolyte. This demonstrates, for the first time, the ability of the latter to serve as a building block in construction of mixed-layer structures. The parent compound PbBi3VO7.5-dCl (d = 0.05) has been investigated by powder XRD, TEM, XPS methods and magnetic susceptibility measurements. An unexpected but important condition for the formation of the mixed-layer structure is partial (ca. 5%) reduction of VV into VIV which probably suppresses competitive formation of apatite-like Pb – Bi vanadates. This reduction also stabilizes the g polymorphic form of Bi2VO5.5 not only in the intergrowth structure, but in Bi2V1-xMxO5.5-y (M – Nb, Sb) solid solutions.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.811
Times cited: 1
DOI: 10.1016/j.solidstatesciences.2017.11.006
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