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Electron energy-loss spectroscopy study of NiTi shape memory alloys”. Yang ZQ, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 214 (2008). http://doi.org/10.1016/j.msea.2006.12.227
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Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM”. Muto S, Schryvers D, MRS Japan: shape memory materials 18, 853 (1993)
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Electron microscopical investigation of AgBr needle crystals”. Goessens C, Schryvers D, van Landuyt J, Millan A, de Keyzer R, Journal of crystal growth 151, 335 (1995). http://doi.org/10.1016/0022-0248(95)00080-1
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Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals”. Goessens C, Schryvers D, van Landuyt J, de Keyzer R, Journal of crystal growth 172, 426 (1997)
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Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al”. Schryvers D, de Saegher B, van Landuyt J, Materials research bulletin 26, 57 (1991)
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Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy”. Seo JW, Schryvers D, Vermeulen W, Richard O, Potapov P, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79, 1279 (1999). http://doi.org/10.1080/01418619908210361
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Electron microscopy of interfaces in new materials”. Van Tendeloo G, Goessens C, Schryvers D, van Haverbergh J, de Veirman A, van Landuyt J s.l., page 200 (1991).
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Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5”. Schryvers D, Tanner LE, Shape memory materials and phenomena: fundamental aspects and applications 246, 33 (1992)
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Electron microscopy studies of martensite microstructures”. Schryvers D, Journal de physique: 4 C5, 109 (1997). http://doi.org/10.1051/jp4:1997517
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Electron microscopy study of Nb-rich nanoprecipitates in NiTiNb and their influence on the martensitic transformation”. Shi H, Pourbabak S, Van Humbeeck J, Schryvers D, Scripta materialia 67, 939 (2012). http://doi.org/10.1016/j.scriptamat.2012.08.020
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Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9”. Seo JW, Schryvers D, Potapov P, , 17 (1998)
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Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 1: precipitation and growth”. Schryvers D, Ma Y, Toth L, Tanner LE, Acta metallurgica et materialia 43, 4045 (1995). http://doi.org/10.1016/0956-7151(95)00101-Z
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Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 2: plate crystallography”. Schryvers D, Ma Y, Toth L, Tanner LE, Acta metallurgica et materialia 43, 4057 (1995). http://doi.org/10.1016/0956-7151(95)00102-2
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Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite”. Schryvers D, van Landuyt JT, Proceedings Of The International Conference On Martensitic Transformations (icomat-92) , 263 (1993)
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ELNES study of carbon K-edge spectra of plasma deposited carbon films”. Hamon A-L, Verbeeck J, Schryvers D, Benedikt J, van den Sanden RMCM, Journal of materials chemistry 14, 2030 (2004). http://doi.org/10.1039/b406468m
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EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys”. Shi H, Frenzel J, Schryvers D, Materials science forum 738/739, 113 (2013). http://doi.org/10.4028/www.scientific.net/MSF.738-739.113
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EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy”. Seo JW, Schryvers D, Vermeulen W, Richard O, Potapov P, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79, 1279 (1999)
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EM study of sensitisation of silver halide grains”. Buschmann V, Schryvers D, van Landuyt J, van Roost C, Icem 13 (1994)
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EM study of twinning in the Ni5Al3 bainitic phase”. Schryvers D, Ma Y, Toth L, Tanner LE, Twinning in advanced materials , 395 (1993)
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Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration”. Schalm O, van der Linden V, Frederickx P, Luyten S, van der Snickt G, Caen J, Schryvers D, Janssens K, Cornelis E, van Dyck D, Schreiner M, Spectrochimica acta: part B : atomic spectroscopy 64, 812 (2009). http://doi.org/10.1016/j.sab.2009.06.005
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Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration”. Caen J, Schalm O, van der Snickt G, van der Linden V, Frederickx P, Schryvers D, Janssens K, Cornelis E, van Dyck D, Schreiner M, , 121 (2005)
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Epitaxial Ni-Al thin films on NaCl using a Ag buffer layer”. Yandouzi M, Toth L, Vasudevan V, Cannaerts M, van Haesendonck C, Schryvers D, Philosophical magazine letters 80, 719 (2000). http://doi.org/10.1080/09500830050192936
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EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
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Evaluation of top, angle, and side cleaned FIB samples for TEM analysis”. Montoya E, Bals S, Rossell MD, Schryvers D, Van Tendeloo G, Microscopy research and technique 70, 1060 (2007). http://doi.org/10.1002/jemt.20514
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Evolution of the phase stability of NiAl under low energy ball milling”. Zelaya E, Esquivel MR, Schryvers D, Advanced powder technology 24, 1063 (2013). http://doi.org/10.1016/j.apt.2013.03.008
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Experimental studies on precursor phenomena in displacive phase transformations”. Schryvers D, Properties Of Complex Inorganic Solids , 321 (1997)
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Fabrication and characterization of functionally graded Ni-Ti multilayer thin films”. Tian H, Schryvers D, Mohanchandra KP, Carman GP, van Humbeeck J, Functional materials letters 2, 61 (2009). http://doi.org/10.1142/S1793604709000570
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Fabrication, interface characterization and modeling of oriented graphite flakes/Si/Al composites for thermal management applications”. Zhou C, Ji G, Chen Z, Wang M, Addad A, Schryvers D, Wang H, Materials and design 63, 719 (2014). http://doi.org/10.1016/j.matdes.2014.07.009
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FCC surface precipitation in Cu-Zn-Al after low angle GA+ ion irradiation”. Zelaya E, Schryvers D, Materials transactions 51, 2177 (2010). http://doi.org/10.2320/matertrans.M2010171
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FIB/SEM applied to quantitative 3D analysis of precipitates in Ni-Ti”. Cao S, Nishida M, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 1284 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.1284
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