| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Bertoni, G.; Verbeeck, J. |
Accuracy and precision in model based EELS quantification |
2008 |
Ultramicroscopy |
108 |
44 |
UA library record; WoS full record; WoS citing articles |
| Turner, S.; Shenderova, O.; da Pieve, F.; Lu, Y.-G.; Yücelen, E.; Verbeeck, J.; Lamoen, D.; Van Tendeloo, G. |
Aberration-corrected microscopy and spectroscopy analysis of pristine, nitrogen containing detonation nanodiamond |
2013 |
Physica status solidi : A : applications and materials science |
210 |
37 |
UA library record; WoS full record; WoS citing articles |
| Tan, H.; Turner, S.; Yücelen, E.; Verbeeck, J.; Van Tendeloo, G. |
2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy |
2011 |
Physical review letters |
107 |
115 |
UA library record; WoS full record; WoS citing articles |
| Vávra, O.; Gaži, S.; Golubović, D.S.; Vávra, I.; Dérer, J.; Verbeeck, J.; Van Tendeloo, G.; Moshchalkov, V.V. |
0 and π phase Josephson coupling through an insulating barrier with magnetic impurities |
2006 |
Physical review : B : condensed matter and materials physics |
74 |
27 |
UA library record; WoS full record; WoS citing articles |
