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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. |
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison |
2007 |
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UA library record |
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van der Snickt, G.; Legrand, S.; Caen, J.; Vanmeert, F.; Alfeld, M.; Janssens, K. |
Chemical imaging of stained-glass windows by means of macro X-ray fluorescence (MA-XRF) scanning |
2016 |
Microchemical journal |
124 |
22 |
UA library record; WoS full record; WoS citing articles |
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Alfeld, M.; Pedroso, J.V.; van Hommes, M.E.; van der Snickt, G.; Tauber, G.; Blaas, J.; Haschke, M.; Erler, K.; Dik, J.; Janssens, K. |
A mobile instrument for in situ scanning macro-XRF investigation of historical paintings |
2013 |
Journal of analytical atomic spectrometry |
28 |
106 |
UA library record; WoS full record; WoS citing articles |
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Janssens, K.; van der Snickt, G.; Vanmeert, F.; Legrand, S.; Nuyts, G.; Alfeld, M.; Monico, L.; Anaf, W.; de Nolf, W.; Vermeulen, M.; Verbeeck, J.; De Wael, K. |
Non-invasive and non-destructive examination of artistic pigments, paints, and paintings by means of X-Ray methods |
2016 |
Topics in Current Chemistry |
374 |
50 |
UA library record; WoS full record; WoS citing articles |
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