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Title
Year
Publication
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Van Aert, S.
;
De Backer, A.
;
Jones, L.
;
Martinez, G.T.
;
Béché, A.
;
Nellist, P.D.
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy
2019
Physical review letters
122
3
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