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Title
Year
Publication
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Alfeld, M.
;
Vekemans, B.
;
Janssens, K.
;
Falkenberg, G.
;
Broekaert, J.A.C.
;
Gao, N.
;
Gibson, D.
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison
2007
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