Number of records found: 1
Home << 1 >>
List View
 | 
Citations
 | 
Details
   web
“Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens KH, Adams FC, van Langevelde F, Vis RD, Jones KW, Rivers M, Sutton S, Advances in X-ray analysis 35, 1265 (1992)
toggle visibility