|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Hawrylak, P.; Peeters, F.; Ensslin, K. |
Carbononics : integrating electronics, photonics and spintronics with graphene quantum dots Preface |
2016 |
Physica status solidi: rapid research letters |
10 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Schelles, W.; van Grieken, R. |
Analysis of nonconducting materials by dc glow discharge spectrometry |
2003 |
|
|
|
UA library record |
|
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
A critical comparison of MINDO/3, MNDO, AM1 and PM3 for a model problem: carbon clusters C2-C10. An ad hoc reparametrization of MNDO well suited for the accurate prediction of their spectroscopic constants |
1991 |
Journal of computational chemistry |
12 |
76 |
UA library record; WoS full record; WoS citing articles |
|
|
van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
|
|
|
UA library record |
|
|
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
|
UA library record |
|
|
Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
|
|
|
UA library record |
|
|
Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
|
|
Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
|
|
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM |
1999 |
Physica status solidi: A: applied research
T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland |
171 |
40 |
UA library record; WoS full record; WoS citing articles |
|
|
van Roy, W.; Struyf, H.; van Vaeck, L.; Gijbels, R.; Caravatti, P. |
A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis |
1994 |
|
|
|
UA library record |
|
|
Steiner, R.E.; Barshick, C.M.; Bogaerts, A. |
Glow discharge optical spectroscopy and mass spectrometry |
2009 |
|
|
|
UA library record |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
|
|
|
UA library record |
|
|
Vertes, A.; Gijbels, R.; Adams, F. |
Introduction |
1993 |
|
|
|
UA library record |
|
|
Vertes, A.; Gijbels, R.; Adams, F. |
Laser ionization mass analysis |
1993 |
|
|
|
UA library record |
|
|
van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Lasers in mass spectrometry: organic and inorganic instrumentation |
1993 |
|
|
|
UA library record |
|
|
Brosens, F.; Fomin, V.M.; Lemmens, L.; Peeters, F.M. |
Liber amicorum in honour of Jozef T. Devreese |
2003 |
|
|
|
UA library record; WoS full record; |
|
|
Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
|
UA library record |
|
|
Vertes, A.; Gijbels, R. |
Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods |
1993 |
|
|
|
UA library record |
|
|
de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
1998 |
|
|
|
UA library record |
|
|
Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
|
|
|
UA library record |
|
|
Bogaerts, A.; Gijbels, R. |
Plasma models |
1997 |
|
|
|
UA library record |
|
|
Peeters, F.M.; Devreese, J.T. |
Polaron effects in heterostructures, quantum wells and superlattices |
1994 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
|
|
|
UA library record |
|
|
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
|
|
UA library record |
|
|
van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Structural characterization of organic molecules by laser mass spectrometry |
1993 |
|
|
|
UA library record |
|
|
Ryabova, A.S.; Bonnefont, A.; Zagrebin, P.; Poux, T.; Sena, R.P.; Hadermann, J.; Abakumov, A.M.; Kerangueven, G.; Istomin, S.Y.; Antipov, E.V.; Tsirlina, G.A.; Savinova, E.R. |
Study of hydrogen peroxide reactions on manganese oxides as a tool to decode the oxygen reduction reaction mechanism |
2016 |
ChemElectroChem |
3 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
Adams, F.; Gijbels, R.; Van Grieken, R. |
Inorganic mass spectrometry |
1988 |
|
|
|
UA library record |
|
|
Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. |
Structural characterization of SnS crystals formed by chemical vapour deposition |
2017 |
Journal of microscopy
T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND |
268 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Tendeloo, G. |
Art, science and sustainability = Kunst, wetenschap en duurzaamheid |
2016 |
|
|
|
UA library record |
|
|
Amin-Ahmadi, B.; Aashuri, H. |
Globular structure of M2 high speed steel by thermomechanical treatment in the semisolid state |
2010 |
Steel research international |
81 |
1 |
UA library record; WoS full record; WoS citing articles |
|