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  Author Title Year Publication Volume Times cited Additional Links Links
Dong, H.M.; Qin, H.; Zhang, J.; Peeters, F.M.; Xu, W. Terahertz absorption window in bilayer graphene 2009 UA library record; WoS full record; pdf
Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration 2005 UA library record
Adams, F.; Gijbels, R.; Van Grieken, R.; Dachang, Z. Inorganic mass spectrometry 1993 UA library record
Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang Inorganic mass spectrometry 1999 UA library record
Idrissi, H.; Schryvers, D. Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization 2012 UA library record
van Vaeck, L.; Gijbels, R. Identification des substances inorganiques et organiques en surface des solides par la microsonde laser 1992 UA library record
van Landuyt, J. High resolution electron microscopy for materials 1992 7 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J. In situ HREM study of electron irradiation effects in AgCl microcrystals 1992 UA library record
Van Tendeloo, G.; Schryvers, D.; Tanner, L.E. Structural instabilities associated with phase transitions: an electron microscopy study 1992 UA library record; WoS full record;
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling 2000 UA library record
Janssens, K.; Bogaerts, A.; van Grieken, R. Colloquium Spectroscopicum Internationale 34: a collection of papers presented at the Colloquium Spectroscopicum Internationale, Antwerp, Belgium, 4-9 September 2005 2006 UA library record
Bogaerts, A.; Janssens, K.; van Grieken, R. Colloquium Spectroscopicum Internationale 34 (CSI 34), Antwerp, Belgium, 4-9 September 2005 2006 UA library record
van Landuyt, J.; Vanhellemont, J. High-resolution electron microscopy for semiconducting materials science 1994 UA library record
Schryvers, D.; Tanner, L.E. On the phase-like nature of the 7m structure in ni-al 1994 1 UA library record; WoS full record; WoS citing articles
Shazali, I.; Van 't dack, L.; Gijbels, R. Preconcentration of precious metals by tellurium sulphide fire-assay followed by instrumental neutron activation analysis 1988 UA library record
Vlasov, I.I.; Turner, S.; Van Tendeloo, G.; Shiryaev, A.A. Recent results on characterization of detonation nanodiamonds 2012 UA library record
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. Study of oxynitrides with dual beam TOF-SIMS 2000 UA library record
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates 2000 UA library record
de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. XPS study of ion induced oxidation of silicon with and without oxygen flooding 2000 UA library record
Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Electron microscopy of fullerenes and fullerene related structures 1994 UA library record
Cao, S.; Nishida, M.; Somsen, C.; Eggeler, G.; Schryvers, D. 3D FIB/SEM study of Ni4Ti3 precipitates in Ni-Ti alloys with different thermal-mechanical histories 2009 1 UA library record; WoS full record; WoS citing articles doi
Tirry, W.; Schryvers, D. 3D strain fields surrounding Ni4Ti3: direct measurement and correlation with the R-phase 2009 UA library record; WoS full record doi
Idrissi, H.; Schryvers, D.; Salje, E.K.H.; Zhang, H.; Carpenter, M.A.; Moya, X. Pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79 2009 2 UA library record; WoS full record; WoS citing articles url doi
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. TEM study of the mechanism of Ni ion release from Nitinol wires with original oxides 2009 1 UA library record; WoS full record; WoS citing articles url doi
Delville, R.; James, R.D.; Salman, U.; Finel, A.; Schryvers, D. Transmission electron microscopy study of low-hysteresis shape memory alloys 2009 3 UA library record; WoS full record; WoS citing articles doi
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Le Tanner HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys (Invited) 1994 UA library record; WoS full record;
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy 1994 UA library record; WoS full record;
de Bleecker, K.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. Modelling of formation and transport of nanoparticles in silane discharges 2004 UA library record
Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. Application of trace element analysis to geothermal waters 1977 UA library record
Neyts, E.; Mao, M.; Eckert, M.; Bogaerts, A. Modeling aspects of plasma-enhanced chemical vapor deposition of carbon-based materials 2012 UA library record
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