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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1996 |
|
|
|
UA library record |
|
|
|
de Hosson, J.T.M.; Van Tendeloo, G. |
Superconducting ceramics |
1997 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G. |
Art, science and sustainability = Kunst, wetenschap en duurzaamheid |
2016 |
|
|
|
UA library record |
|
|
|
Bogaerts, A.; Schelles, W.; van Grieken, R. |
Analysis of nonconducting materials by dc glow discharge spectrometry |
2003 |
|
|
|
UA library record |
|
|
|
van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
|
|
|
UA library record |
|
|
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
|
UA library record |
|
|
|
Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
|
|
|
UA library record |
|
|
|
Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
|
|
|
Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
|
|
|
van Roy, W.; Struyf, H.; van Vaeck, L.; Gijbels, R.; Caravatti, P. |
A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis |
1994 |
|
|
|
UA library record |
|
|
|
Steiner, R.E.; Barshick, C.M.; Bogaerts, A. |
Glow discharge optical spectroscopy and mass spectrometry |
2009 |
|
|
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
|
|
|
UA library record |
|
|
|
Vertes, A.; Gijbels, R.; Adams, F. |
Introduction |
1993 |
|
|
|
UA library record |
|
|
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Vertes, A.; Gijbels, R.; Adams, F. |
Laser ionization mass analysis |
1993 |
|
|
|
UA library record |
|
|
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van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Lasers in mass spectrometry: organic and inorganic instrumentation |
1993 |
|
|
|
UA library record |
|
|
|
Brosens, F.; Fomin, V.M.; Lemmens, L.; Peeters, F.M. |
Liber amicorum in honour of Jozef T. Devreese |
2003 |
|
|
|
UA library record; WoS full record; |
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|
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Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
|
UA library record |
|
|
|
Vertes, A.; Gijbels, R. |
Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods |
1993 |
|
|
|
UA library record |
|
|
|
de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
1998 |
|
|
|
UA library record |
|
|
|
Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
|
|
|
UA library record |
|
|
|
Bogaerts, A.; Gijbels, R. |
Plasma models |
1997 |
|
|
|
UA library record |
|
|
|
Peeters, F.M.; Devreese, J.T. |
Polaron effects in heterostructures, quantum wells and superlattices |
1994 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
|
|
|
UA library record |
|
|
|
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
|
|
UA library record |
|
|
|
van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Structural characterization of organic molecules by laser mass spectrometry |
1993 |
|
|
|
UA library record |
|
|
|
Adams, F.; Gijbels, R.; Van Grieken, R. |
Inorganic mass spectrometry |
1988 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
|
|
|
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
|
|
|
Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
|
|
|
UA library record |
|
|
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Marmorkos, I.K.; Schweigert, V.A.; Peeters, F.M.; Lok, J.G.S. |
Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices |
1996 |
|
|
|
UA library record |
|
