Number of records found: 980
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Citations
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1996).
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Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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Art, science and sustainability = Kunst, wetenschap en duurzaamheid”. Van Tendeloo G Vrienden van het M HKA, Antwerpen, page 24 (2016).
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Analysis of nonconducting materials by dc glow discharge spectrometry”. Bogaerts A, Schelles W, van Grieken R Wiley, Chichester, page 293 (2003).
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Depth profiling of coated steel wires by GDMS”. van Straaten M, Butaye L, Gijbels R, , 629 (1992)
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Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 479 (1992)
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Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, , 479 (1991)
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Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis”. Oleshko VP, Gijbels R, Amelinckx S Wiley, Chichester, page 1 (2013).
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A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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Glow discharge optical spectroscopy and mass spectrometry”. Steiner RE, Barshick CM, Bogaerts A Wiley, Chichester, page 1 (2009).
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Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals”. Verlinden G, Gijbels R, Geuens I, Benninghoven A, , 871 (1998)
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Introduction”. Vertes A, Gijbels R, Adams F Wiley, New York, page 1 (1993).
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Vertes A, Gijbels R, Adams F (1993) Laser ionization mass analysis. Wiley, New York
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Lasers in mass spectrometry: organic and inorganic instrumentation”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 7 (1993).
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Liber amicorum in honour of Jozef T. Devreese”. Brosens F, Fomin VM, Lemmens L, Peeters FM Wiley, Weinheim (2003).
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Mass spectrometry, inorganic”. Adams F, Gijbels R, Jambers W, van Grieken R Wiley, Chichester, page 2650 (1998).
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Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods”. Vertes A, Gijbels R Wiley, New York, page 127 (1993).
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Modeling of bombardment induced oxidation of silicon with and without oxygen flooding”. de Witte H, Vandervorst W, Gijbels R, , 327 (1998)
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Numerical modelling of analytical glow discharges”. Bogaerts A, Gijbels R Wiley, Chichester, page 155 (2003).
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Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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Polaron effects in heterostructures, quantum wells and superlattices”. Peeters FM, Devreese JT, , 99 (1994)
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Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods”. Verlinden G, Gijbels R, Geuens I, , 995 (1998)
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Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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Structural characterization of organic molecules by laser mass spectrometry”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 177 (1993).
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Inorganic mass spectrometry”. Adams F, Gijbels R, Van Grieken R Wiley, Chichester, page 404 p. (1988).
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Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
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Scanning microanalysis”. Oleshko V, Gijbels R Wiley-VCH, Weinheim, page 427 (1997).
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Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
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Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices”. Marmorkos IK, Schweigert VA, Peeters FM, Lok JGS, , 2769 (1996)
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