Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Sels, D.; Sorée, B.; Groeseneken, G. |
2-D rotational invariant multi sub band Schrödinger-Poisson solver to model nanowire transistors |
2010 |
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UA library record |
Mitchell, T.E.; Gronsky, R.; Van Tendeloo, G. |
Oxide superconductors: electron microscopy |
1992 |
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UA library record |
Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry |
1996 |
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UA library record |
Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Hervieu, M.; Raveau, B.; Greaves, C. |
Atomic resolution of interfaces in ceramic-superconductors |
1995 |
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UA library record |
Sorée, B.; Pham, A.-T.; Sels, D.; Magnus, W. |
The junctionless nanowire transistor |
2011 |
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UA library record |
Magnus, W.; Carrillo-Nunez, H.; Sorée, B. |
Transport in nanostructures |
2011 |
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UA library record |
Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharge plasmas with copper cathode |
2002 |
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UA library record |
Meynen, V.; Busuioc, A.M.; Beyers, E.; Cool, P.; Vansant, E.F.; Bilba, N.; Mertens, M.; Lebedev, O.; Van Tendeloo, G. |
Nanodesign of combined micro- and mesoporous materials for specific applications in adsorption and catalysis |
2007 |
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UA library record |
Raveau, B.; Hervieu, M.; Michel, C.; Martin, C.; Maignan, A.; Van Tendeloo, G. |
Crystal chemistry of mercury based layered cuprates and oxycarbonates |
1995 |
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UA library record |
Bals, S.; Stes, A.; Celis, V. |
Klassieke toetsing in de praktijk |
2009 |
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UA library record |
Peeters, F.M. |
The phase diagram |
1997 |
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UA library record |
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation |
1997 |
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UA library record |
Colomer, J.-F.; Van Tendeloo, G. |
Electron diffraction and microscopy of single-walled carbon nanotube bundles |
2003 |
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UA library record |
Devreese, J.T.; Shi, J.M.; Peeters, F.M. |
Magneto-polaron effect on shallow donors in 3D en Q2S systems |
1993 |
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UA library record |
Bogaerts, A.; van Straaten, M.; Gijbels, R. |
Mathematical modelling of an analytical glow discharge |
1995 |
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UA library record |
Frederickx, P.; De Vis, K.; Wouters, H.; Helary, D.; Schryvers, D. |
Nanoparticles in glass and glazes |
2005 |
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UA library record |
Peeters, F.M.; Partoens, B.; Kong, M. |
The classical electron gas in artificial structures |
2004 |
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UA library record |
Gijbels, R. |
The many faces of TOF-SIMS for the characterization of solid (sub)surfaces |
2003 |
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UA library record |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
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UA library record |
Adams, F.; Gijbels, R.; Van Grieken, R.; Dachang, Z. |
Inorganic mass spectrometry |
1993 |
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UA library record |
Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
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UA library record |
Idrissi, H.; Schryvers, D. |
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization |
2012 |
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UA library record |
van Vaeck, L.; Gijbels, R. |
Identification des substances inorganiques et organiques en surface des solides par la microsonde laser |
1992 |
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UA library record |
Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
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UA library record |
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
Janssens, K.; Bogaerts, A.; van Grieken, R. |
Colloquium Spectroscopicum Internationale 34: a collection of papers presented at the Colloquium Spectroscopicum Internationale, Antwerp, Belgium, 4-9 September 2005 |
2006 |
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UA library record |
Bogaerts, A.; Janssens, K.; van Grieken, R. |
Colloquium Spectroscopicum Internationale 34 (CSI 34), Antwerp, Belgium, 4-9 September 2005 |
2006 |
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UA library record |
van Landuyt, J.; Vanhellemont, J. |
High-resolution electron microscopy for semiconducting materials science |
1994 |
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UA library record |
Shazali, I.; Van 't dack, L.; Gijbels, R. |
Preconcentration of precious metals by tellurium sulphide fire-assay followed by instrumental neutron activation analysis |
1988 |
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UA library record |