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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
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UA library record |
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Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
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|
UA library record |
|
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM |
1999 |
Physica status solidi: A: applied research
T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland |
171 |
40 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Roy, W.; Struyf, H.; van Vaeck, L.; Gijbels, R.; Caravatti, P. |
A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis |
1994 |
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UA library record |
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Steiner, R.E.; Barshick, C.M.; Bogaerts, A. |
Glow discharge optical spectroscopy and mass spectrometry |
2009 |
|
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
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UA library record |
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Vertes, A.; Gijbels, R.; Adams, F. |
Introduction |
1993 |
|
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UA library record |
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Vertes, A.; Gijbels, R.; Adams, F. |
Laser ionization mass analysis |
1993 |
|
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UA library record |
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van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Lasers in mass spectrometry: organic and inorganic instrumentation |
1993 |
|
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UA library record |
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Brosens, F.; Fomin, V.M.; Lemmens, L.; Peeters, F.M. |
Liber amicorum in honour of Jozef T. Devreese |
2003 |
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UA library record; WoS full record; |
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Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
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UA library record |
|
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Vertes, A.; Gijbels, R. |
Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods |
1993 |
|
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UA library record |
|
|
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de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
1998 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
|
|
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Plasma models |
1997 |
|
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|
UA library record |
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Peeters, F.M.; Devreese, J.T. |
Polaron effects in heterostructures, quantum wells and superlattices |
1994 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
|
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UA library record |
|
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Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
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|
UA library record |
|
|
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van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Structural characterization of organic molecules by laser mass spectrometry |
1993 |
|
|
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UA library record |
|
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Ryabova, A.S.; Bonnefont, A.; Zagrebin, P.; Poux, T.; Sena, R.P.; Hadermann, J.; Abakumov, A.M.; Kerangueven, G.; Istomin, S.Y.; Antipov, E.V.; Tsirlina, G.A.; Savinova, E.R. |
Study of hydrogen peroxide reactions on manganese oxides as a tool to decode the oxygen reduction reaction mechanism |
2016 |
ChemElectroChem |
3 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
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Adams, F.; Gijbels, R.; Van Grieken, R. |
Inorganic mass spectrometry |
1988 |
|
|
|
UA library record |
|
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Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. |
Structural characterization of SnS crystals formed by chemical vapour deposition |
2017 |
Journal of microscopy
T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND |
268 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
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Liz-Marzan, L.; Bals, S. |
Advanced particle characterization techniques |
2016 |
Particle and particle systems characterization |
33 |
|
UA library record; WoS full record |
|
|
|
Hawrylak, P.; Peeters, F.; Ensslin, K. |
Carbononics : integrating electronics, photonics and spintronics with graphene quantum dots Preface |
2016 |
Physica status solidi: rapid research letters |
10 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
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Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
|
|
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
|
|
|
Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
|
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UA library record |
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Lutz, L.; Corte, D.A.D.; Chen, Y.; Batuk, D.; Johnson, L.R.; Abakumov, A.; Yate, L.; Azaceta, E.; Bruce, P.G.; Tarascon, J.-M.; Grimaud, A. |
The role of the electrode surface in Na-Air batteries : insights in electrochemical product formation and chemical growth of NaO2 |
2018 |
Advanced energy materials |
8 |
13 |
UA library record; WoS full record; WoS citing articles |
|
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Dimitrievska, M.; Shea, P.; Kweon, K.E.; Bercx, M.; Varley, J.B.; Tang, W.S.; Skripov, A.V.; Stavila, V.; Udovic, T.J.; Wood, B.C. |
Carbon Incorporation and Anion Dynamics as Synergistic Drivers for Ultrafast Diffusion in Superionic LiCB11H12 and NaCB11H12 |
2018 |
Advanced energy materials |
8 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Marmorkos, I.K.; Schweigert, V.A.; Peeters, F.M.; Lok, J.G.S. |
Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices |
1996 |
|
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|
UA library record |
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