Number of records found: 8873
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Vibrational properties of graphene fluoride and graphane”. Peelaers H, Hernández-Nieves AD, Leenaerts O, Partoens B, Peeters FM, Applied physics letters 98, 051914 (2011). http://doi.org/10.1063/1.3551712
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Vortex manipulation in a superconducting matrix with view on applications”. Milošević, MV, Peeters FM, Applied physics letters 96, 192501 (2010). http://doi.org/10.1063/1.3425672
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Wavevector filtering through single-layer and bilayer graphene with magnetic barrier structures”. Masir MR, Vasilopoulos P, Peeters FM, Applied physics letters 93, 242103 (2008). http://doi.org/10.1063/1.3049600
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Why are sputter deposited Nd1+xBa2-xCu3O7-\delta thin films flatter than NdBa2Cu3O7-\delta films?”.Bals S, Van Tendeloo G, Salluzzo M, Maggio-Aprile I, Applied physics letters 79, 3660 (2001). http://doi.org/10.1063/1.1421622
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Zener tunneling in semiconductors under nonuniform electric fields”. Vandenberghe W, Sorée B, Magnus W, Groeseneken G, Journal of applied physics 107, 054520 (2010). http://doi.org/10.1063/1.3311550
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Collapse of the low temperature insulating state in Cr-doped V2O3 thin films”. Homm P, Dillemans L, Menghini M, Van Bilzen B, Bakalov P, Su CY, Lieten R, Houssa M, Nasr Esfahani D, Covaci L, Peeters FM, Seo JW, Locquet JP;, Applied physics letters 107, 111904 (2015). http://doi.org/10.1063/1.4931372
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Comparison of short-channel effects in monolayer MoS2 based junctionless and inversion-mode field-effect transistors”. Agarwal T, Sorée B, Radu I, Raghavan P, Fiori G, Iannaccone G, Thean A, Heyns M, Dehaene W, Applied physics letters 108, 023506 (2016). http://doi.org/10.1063/1.4939933
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First-principles thermodynamics and defect kinetics guidelines for engineering a tailored RRAM device”. Clima S, Chen YY, Chen CY, Goux L, Govoreanu B, Degraeve R, Fantini A, Jurczak M, Pourtois G, Journal of applied physics 119, 225107 (2016). http://doi.org/10.1063/1.4953673
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Full-zone spectral envelope function formalism for the optimization of line and point tunnel field-effect transistors”. Verreck D, Verhulst AS, Van de Put M, Sorée B, Magnus W, Mocuta A, Collaert N, Thean A, Groeseneken G, Journal of applied physics 118, 134502 (2015). http://doi.org/10.1063/1.4931890
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Inter-ribbon tunneling in graphene: An atomistic Bardeen approach”. Van de Put ML, Vandenberghe WG, Sorée B, Magnus W, Fischetti MV, Journal of applied physics 119, 214306 (2016). http://doi.org/10.1063/1.4953148
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Modeling surface roughness scattering in metallic nanowires”. Moors K, Sorée B, Magnus W, Journal of applied physics 118, 124307 (2015). http://doi.org/10.1063/1.4931573
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On the manifestation of phosphorus-vacancy complexes in epitaxial Si:P films”. Dhayalan SK, Kujala J, Slotte J, Pourtois G, Simoen E, Rosseel E, Hikavyy A, Shimura Y, Iacovo S, Stesmans A, Loo R, Vandervorst W;, Applied physics letters 108, 082106 (2016). http://doi.org/10.1063/1.4942605
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Pentagonal monolayer crystals of carbon, boron nitride, and silver azide”. Yagmurcukardes M, Sahin H, Kang J, Torun E, Peeters FM, Senger RT, Journal of applied physics 118, 104303 (2015). http://doi.org/10.1063/1.4930086
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Quantum tunneling between bent semiconductor nanowires”. de Sousa AA, Chaves A, Pereira TAS, Farias GA, Peeters FM, Journal of applied physics 118, 174301 (2015). http://doi.org/10.1063/1.4934646
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Skyrmion-induced bound states on the surface of three-dimensional topological insulators”. Andrikopoulos D, Sorée B, De Boeck J, Journal of applied physics 119, 193903 (2016). http://doi.org/10.1063/1.4950759
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Superconductor-ferromagnet bilayer under external drive : the role of vortex-antivortex matter”. Frota DA, Chaves A, Ferreira WP, Farias GA, Milošević, MV, Journal of applied physics 119, 093912 (2016). http://doi.org/10.1063/1.4943364
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On the structural and electronic properties of Ir-silicide nanowires on Si(001) surface”. Fatima, Oguz IC, Çakir D, Hossain S, Mohottige R, Gulseren O, Oncel N, Journal of applied physics 120, 095303 (2016). http://doi.org/10.1063/1.4961550
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Thick homoepitaxial (110)-oriented phosphorus-doped n-type diamond”. Balasubramaniam Y, Pobedinskas P, Janssens SD, Sakr G, Jomard F, Turner S, Lu YG, Dexters W, Soltani A, Verbeeck J, Barjon J, Nesládek M, Haenen K;, Applied physics letters 109, 062105 (2016). http://doi.org/10.1063/1.4960970
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Strain controlled valley filtering in multi-terminal graphene structures”. Milovanović, SP, Peeters FM, Applied physics letters 109, 203108 (2016). http://doi.org/10.1063/1.4967977
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Band alignment of lateral two-dimensional heterostructures with a transverse dipole”. Leenaerts O, Vercauteren S, Partoens B, Applied physics letters 110, 181602 (2017). http://doi.org/10.1063/1.4982791
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Can p-channel tunnel field-effect transistors perform as good as n-channel?”.Verhulst AS, Verreck D, Pourghaderi MA, Van de Put M, Sorée B, Groeseneken G, Collaert N, Thean AV-Y, Applied physics letters 105, 043103 (2014). http://doi.org/10.1063/1.4891348
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Electric-field induced quantum broadening of the characteristic energy level of traps in semiconductors and oxides”. Mohammed M, Verhulst AS, Verreck D, Van de Put M, Simoen E, Sorée B, Kaczer B, Degraeve R, Mocuta A, Collaert N, Thean A, Groeseneken G, Journal of applied physics 120, 245704 (2016). http://doi.org/10.1063/1.4972482
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Role of intrinsic molecular dipole in energy level alignment at organic interfaces”. Lindell L, Çakir D, Brocks G, Fahlman M, Braun S, Applied Physics Letters 102, 223301 (2013). http://doi.org/10.1063/1.4809567
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Anisotropic electronic, mechanical, and optical properties of monolayer WTe2”. Torun E, Sahin H, Cahangirov S, Rubio A, Peeters FM, Journal of applied physics 119, 074307 (2016). http://doi.org/10.1063/1.4942162
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Origin of the performances degradation of two-dimensional-based metal-oxide-semiconductor field effect transistors in the sub-10 nm regime: A first-principles study”. Lu AKA, Pourtois G, Agarwal T, Afzalian A, Radu IP, Houssa M, Applied physics letters 108, 043504 (2016). http://doi.org/10.1063/1.4940685
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Stress dependence of the suspended graphene work function : vacuum Kelvin probe force microscopy and density functional theory”. Volodin A, Van Haesendonck C, Leenaerts O, Partoens B, Peeters FM, Applied physics letters 110, 193101 (2017). http://doi.org/10.1063/1.4982931
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Towards rapid nanoscale measurement of strain in III-nitride heterostructures”. Jones E, Cooper D, Rouvière J-L, Béché, A, Azize M, Palacios T, Gradecak S, Applied Physics Letters 103, 231904 (2013). http://doi.org/10.1063/1.4838617
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Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography”. Cooper D, Rouvière J-L, Béché, A, Kadkhodazadeh S, Semenova ES, Dunin-Borkowsk R, Applied physics letters 99, 261911 (2011). http://doi.org/10.1063/1.3672194
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Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy”. Cooper D, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 100, 233121 (2012). http://doi.org/10.1063/1.4723572
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Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy”. Cooper D, Denneulin T, Barnes J-P, Hartmann J-M, Hutin L, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 112, 124505 (2012). http://doi.org/10.1063/1.4767925
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