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The influence of the cationic ratio on the incorporation of Ti4+ in the brucite-like sheets of layered double hydroxides”. Seftel EM, Popovici E, Mertens M, Van Tendeloo G, Cool P, Vansant E, Microporous and mesoporous materials: zeolites, clays, carbons and related materials 111, 12 (2008). http://doi.org/10.1016/j.micromeso.2007.07.008
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Influence of the microstructure on the high-temperature transport properties of GdBaCo2O5.5+\delta epitaxial films”. Burriel M, Casa-Cabanas M, Zapata J, Tan H, Verbeeck J, Solis C, Roqueta J, Skinner SJ, Kilner JA, Van Tendeloo G, Santiso J, Chemistry of materials 22, 5512 (2010). http://doi.org/10.1021/cm101423z
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Influence of the structure on the properties of NaxEuy(MoO4)z red phosphors”. Morozov VA, Lazoryak BI, Shmurak SZ, Kiselev AP, Lebedev OI, Gauquelin N, Verbeeck J, Hadermann J, Van Tendeloo G, Chemistry of materials 26, 3238 (2014). http://doi.org/10.1021/cm500966g
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Influence of the synthesis parameters of TiO2-SBA-15 materials on the adsorption and photodegradation of rhodamine-6G”. de Witte K, Busuioc AM, Meynen V, Mertens M, Bilba N, Van Tendeloo G, Cool P, Vansant EF, Microporous and mesoporous materials: zeolites, clays, carbons and related materials 110, 100 (2008). http://doi.org/10.1016/j.micromeso.2007.09.035
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Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, Depla D, de Gryse R, Lebedev OI, Van Tendeloo G, Thin solid films : an international journal on the science and technology of thin and thick films 484, 18 (2005). http://doi.org/10.1016/j.tsf.2005.01.021
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Influence of twinning on the morphology of AgBr and AgCl microcrystals”. van Renterghem W, Goessens C, Schryvers D, van Landuyt J, Bollen D, de Keyzer R, van Roost C, The journal of imaging science and technology 45, 349 (2001)
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Influence of water on the pillaring of montmorillonite with aminopropyltriethoxysilane”. Ahenach J, Cool P, Vansant EF, Lebedev O, van Landuyt J, Physical chemistry, chemical physics 1, 3703 (1999). http://doi.org/10.1039/a901888c
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Infrared spectra of type laB diamonds”. Woods GS, Kiflawi I, Luyten W, Van Tendeloo G, Philosophical magazine letters 67, 405 (1993). http://doi.org/10.1080/09500839308240950
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Insight into the growth of multiple branched MnOOH nanorods”. Li Y, Tan H, Lebedev O, Verbeeck J, Biermans E, Van Tendeloo G, Su B-L, Crystal growth &, design 10, 2969 (2010). http://doi.org/10.1021/cg100009k
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Insights on growth and nanoscopic investigation of uncommon iron oxide polymorphs”. Carraro G, Maccato C, Bontempi E, Gasparotto A, Lebedev OI, Turner S, Depero LE, Van Tendeloo G, Barreca D, European journal of inorganic chemistry , 5454 (2013). http://doi.org/10.1002/ejic.201300873
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Interface controlled electronic variations in correlated heterostructures”. Gehrke K, Moshnyaga V, Samwer K, Lebedev OI, Verbeeck J, Kirilenko D, Van Tendeloo G, Physical review : B : condensed matter and materials physics 82, 113101 (2010). http://doi.org/10.1103/PhysRevB.82.113101
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Interface-induced modulation of charge and polarization in thin film Fe3O4”. Tian H, Verbeeck J, Brück S, Paul M, Kufer D, Sing M, Claessen R, Van Tendeloo G, Advanced materials 26, 461 (2014). http://doi.org/10.1002/adma.201303329
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Interfacial spin glass state and exchange bias in manganite bilayers with competing magnetic orders”. Ding JF, Lebedev OI, Turner S, Tian YF, Hu WJ, Seo JW, Panagopoulos C, Prellier W, Van Tendeloo G, Wu T, Physical review : B : condensed matter and materials physics 87, 054428 (2013). http://doi.org/10.1103/PhysRevB.87.054428
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Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy”. Lu J, Roeffaers MBJ, Bartholomeeusen E, Sels BF, Schryvers D, Microscopy and microanalysis 20, 42 (2014). http://doi.org/10.1017/S1431927613013731
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Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
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Interplay of atomic displacement in the quantum magnet (CuCI)LaNb2O7”. Tsirlin AA, Abakumov AM, Van Tendeloo G, Rosner H, Physical review : B : condensed matter and materials physics 82, 054107 (2010). http://doi.org/10.1103/PhysRevB.82.054107
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Interplay of doping and structural modulation in superconducting Bi2Sr2-xLaxCuO6+\delta thin films”. Li ZZ, Raffy H, Bals S, Van Tendeloo G, Megtert S, Physical review : B : condensed matter and materials physics 71, 174503 (2005). http://doi.org/10.1103/PhysRevB.71.174503
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Interpretation of electron diffraction from carbon nanotube bundles presenting precise helicity”. Colomer J-F, Henrard L, Launois P, Van Tendeloo G, Lucas AA, Lambin P, Physical review : B : condensed matter and materials physics 70, 075408 (2004). http://doi.org/10.1103/PhysRevB.70.075408
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Interpretation of “Energy-filtered electron-diffracted beam holography&rdquo, by R.A. Herring”. Verbeeck J, Ultramicroscopy 106, 461 (2006). http://doi.org/10.1016/j.ultramic.2005.12.004
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Intrinsic thermal instability of methylammonium lead trihalide perovskite”. Conings B, Drijkoningen J, Gauquelin N, Babayigit A, D'Haen J, D'Olieslaeger L, Ethirajan A, Verbeeck J, Manca J, Mosconi E, Angelis FD, Boyen HG;, Laser physics review 5, 1500477 (2015). http://doi.org/10.1002/aenm.201500477
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Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures”. Stuer C, van Landuyt J, Bender H, de Wolf I, Rooyackers R, Badenes G, Journal of the electrochemical society 148, G597 (2001). http://doi.org/10.1149/1.1404970
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Investigation by electron diffraction microscopy of (RE)BaCuOS polycrystalline ceramic compounds: interpretation of unexpected superstructures and influence of secondary phases”. Cloots R, Rulmont A, Krekels T, Van Tendeloo G, Diko P, Ausloos M, Journal of crystal growth 129, 394 (1993)
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Investigation of stacking disorder in Li2SnO3”. Tarakina NV, Denisova TA, Maksimova LG, Baklanova YV, Tyutyunnik AP, Berger IF, Zubkov VG, Van Tendeloo G, Zeitschrift für Kristallographie , 375 (2009). http://doi.org/10.1524/zksu.2009.0055
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Investigation of the morphology of the mesoporous SBA-16 and SBA-15 materials”. Stevens WJJ, Lebeau K, Mertens M, Van Tendeloo G, Cool P, Vansant EF, The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical 110, 9183 (2006). http://doi.org/10.1021/jp0548725
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Ion beam synthesis of β-SiC at 9500C and structural characterization”. Frangis N, Nejim A, Hemment PLF, Stoemenos J, van Landuyt J, Nuclear instruments and methods in physics research B112, 325 (1996)
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Ion beam synthesis of Te and Bi nanoclusters in silicon: the effect of post-implantation high frequency electromagnetic field”. Kalitzova M, Peeva A, Ignatova V, Lebedev OI, Zollo G, Vitali G, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 242, 209 (2006). http://doi.org/10.1016/j.nimb.2005.08.017
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Ion current rectification, limiting and overlimiting conductances in nanopores”. van Oeffelen L, Van Roy W, Idrissi H, Charlier D, Lagae L, Borghs G, PLoS ONE 10, e0124171 (2015). http://doi.org/10.1371/journal.pone.0124171
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Iron catalysts for the growth of carbon nanofibers : Fe, Fe3C or both?”.He Z, Maurice J-L, Gohier A, Lee CS, Pribat D, Cojocaru CS, Chemistry of materials 23, 5379 (2011). http://doi.org/10.1021/cm202315j
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Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?”.van Dyck D, Van Aert S, den Dekker AJ, van den Bos A, Ultramicroscopy 98, 27 (2003). http://doi.org/10.1016/S0304-3991(03)00023-8
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Is there a relationship between the stacking fault character and the activated mode of plasticity of FeMn-based austenitic steels?”.Idrissi H, Ryelandt L, Veron M, Schryvers D, Jacques PJ, Scripta materialia 60, 941 (2009). http://doi.org/10.1016/j.scriptamat.2009.01.040
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