Number of records found: 3074
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Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix”. Schryvers D, Tirry W, Yang Z, , 205 (2005)
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Comparative study of structural properties and photoluminescence in InGaN layers with a high In content”. Vantomme A, Wu MF, Hogg S, van Landuyt J, et al, Internet journal of nitride semiconductor research T2 –, Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS 5, art. no.-W11.38 (2000)
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Structure and magnetotransport properties of La2/3Ca1/3MnO3 thin films prepared by pulsed laser deposition”. Lebedev OI, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, Phillipp F, Materials Research Society symposium proceedings T2 –, Symposium on Advances in Laser Ablation of Materials at the 1998 MRS, Spring Meeting, April 13-16, 1998, San Francisco, Calif. , 219 (1998). http://doi.org/10.1557/PROC-526-219
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Klassieke toetsing in de praktijk”. Bals S, Stes A, Celis V LannooCampus, Leuven, page 211 (2009).
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Electron-microscopy and the structural studies of superconducting materials and fullerites”. Van Tendeloo G, Amelinckx S, NATO Advanced Study Institutes series: series E : applied sciences T2 –, NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy , 521 (1994)
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Formation of a Ti-siliceous trimodal material with macroholes, mesopores and zeolitic features via a one-pot templating synthesis”. Vernimmen J, Meynen V, Mertens M, Lebedev OI, Van Tendeloo G, Cool P, Journal of porous materials 19, 153 (2012). http://doi.org/10.1007/s10934-011-9470-0
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Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J Kluwer Academic, s.l., page 63 (1997).
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The local structure of YBCO based materials by TEM”. Van Tendeloo G, Lebedev OI, Verbist K, Abakumov AM, Shpanchenko RV, Antipov EV, Blank DHA Kluwer Academic, Dordrecht, page 11 (1999).
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Electron diffraction and microscopy of single-walled carbon nanotube bundles”. Colomer J-F, Van Tendeloo G Kluwer, Boston, Mass., page 45 (2003).
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A scanning electron microscopy study on hollow silica microspheres: defects and influences of the synthesis composition”. Liu S, Wei M, Sui X, Cheng X, Cool P, Van Tendeloo G, Journal of sol-gel science and technology 49, 373 (2009). http://doi.org/10.1007/s10971-008-1875-0
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Structure of artificial grain boundaries in sapphire bicrystals with intermediate layers”. Vasiliev AL, Stepantsov EA, Ivanov ZG, Olsson E, Verbist K, Van Tendeloo G, Interface science 5, 223 (1997)
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Nanoparticles in glass and glazes”. Frederickx P, De Vis K, Wouters H, Helary D, Schryvers D, (2005)
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Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9”. Seo JW, Schryvers D, Potapov P, , 17 (1998)
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HREM investigation of La(1-x)Ca(x)MnO3-delta thin films”. Lebedev O, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, , 517 (1998)
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The effect of Y2O3 and YFeO3 additions on the critical current density of YBCO coated conductors”. Lao M, Eisterer M, Stadel O, Meledin A, Van Tendeloo G, 1-4 (2014). http://doi.org/10.1088/1742-6596/507/2/022012
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HREM investigation of a Fe/GaN/Fe tunnel junction”. Nistor L, Bender H, van Landuyt J, Nemeth S, Boeve H, De Boeck J, Borghs G, Institute of physics conference series T2 –, Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England , 53 (2001)
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Self-assembly of gas-phase synthesized magnesium nanoparticles on room temperature substrates”. Venturi F, Calizzi M, Bals S, Perkisas T, Pasquini L, Materials research express 2, 015007 (2015). http://doi.org/10.1088/2053-1591/2/1/015007
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A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films”. Nistor LC, Richard O, Zhao O, Bender H, Stesmans A, Van Tendeloo G, Institute of physics conference series T2 –, Microscopy of semiconducting materials , 397 (2003)
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Community structure and feeding preference of nematodes associated with methane seepage at the Darwin mud volcano (Gulf of Cádiz)”. Pape E, Bezerra TN, Vanneste H, Heeschen K, Moodley L, Leroux F, van Breugel P, Vanreusel A, Marine ecology progress series 438, 71 (2011). http://doi.org/10.3354/meps09278
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Superspace crystallography : a key to the chemistry and properties”. Pinheiro CB, Abakumov AM, IUCrJ 2, 137 (2015). http://doi.org/10.1107/S2052252514023550
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Influence of substrate tilt angle on the incorporation of BaHfO3 in thick YBa2Cu3O7-&delta, films”. Sieger M, Pahlke P, Ottolinger R, Stafford BH, Lao M, Meledin A, Bauer M, Eisterer M, Van Tendeloo G, Schultz L, Nielsch K, Hühne R, IEEE transactions on applied superconductivity 27, 1 (2016). http://doi.org/10.1109/Tasc.2016.2631587
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Point defect reactions in silicon studied in situ by high flux electron irradiation in high voltage transmission electron microscope”. Vanhellemont J, Romano Rodriguez A, Fedina L, van Landuyt J, Aseev A, Materials science and technology 11, 1194 (1995). http://doi.org/10.1179/mst.1995.11.11.1194
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Reliability of copper dual damascene influenced by pre-clean”. Tokei Z, Lanckmans F, van den Bosch G, Van Hove M, Maex K, Bender H, Hens S, van Landuyt J, Analysis Of Integrated Circuits , 118 (2002). http://doi.org/10.1109/IPFA.2002.1025629
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Process variability in Cu2ZnSnSe4 solar cell devices: Electrical and structural investigations”. Brammertz G, Buffiere M, Verbist C, Bekaert J, Batuk M, Hadermann J, et al, The conference record of the IEEE Photovoltaic Specialists Conference T2 –, IEEE 42nd Photovoltaic Specialist Conference (PVSC), JUN 14-19, 2015, New Orleans, LA (2015)
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High resolution electron microscopy from imaging towards measuring”. Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3. Ieee, page 2081 (2001).
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Ciliary white light generated during femtosecond laser ablation on transparent dielectrics”. Liu Y, Brelet Y, He Z, Yu L, Mitryukovskiy S, Houard A, Forestier B, Couairon A, Mysyrowicz A, 2013 Conference On And International Quantum Electronics Conference Lasers And Electro-optics Europe (cleo Europe/iqec) (2013)
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Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration”. Caen J, Schalm O, van der Snickt G, van der Linden V, Frederickx P, Schryvers D, Janssens K, Cornelis E, van Dyck D, Schreiner M, , 121 (2005)
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Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization”. Idrissi H, Schryvers D Formatex Research Center, S.l., page 1213 (2012).
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High resolution electron microscopy for materials”. van Landuyt J Eurem 92, Granada, page 23 (1992).
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In situ HREM study of electron irradiation effects in AgCl microcrystals”. Goessens C, Schryvers D, de Keyzer R, van Landuyt J Eurem 92, Granada, page 646 (1992).
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