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Author
Title
Year
Publication
Volume
Times cited
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de Gryse, O.
;
Clauws, P.
;
Lebedev, O.
;
van Landuyt, J.
;
Vanhellemont, J.
;
Claeys, C.
;
Simoen, E.
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
2001
Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY
308
3
UA library record
;
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;
WoS citing articles
Aguiar, J.A.
;
Roa-Rojas, J.
;
Parra Vargas, C.A.
;
Landinez Tellez, D.A.
;
Corredor Bohorquez, L.T.
;
Shanenko, A.
;
Jardim, R.F.
;
Peeters, F.
Preface
2014
Physica: B : condensed matter
455
UA library record
;
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;
WoS full record