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“The junctionless nanowire transistor”. Sorée B, Pham A-T, Sels D, Magnus W Pan Stanford, S.l., page ? (2011).
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“Transport in nanostructures”. Magnus W, Carrillo-Nunez H, Sorée B Pan Stanford, S.l. (2011).
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“Oxide superconductors: electron microscopy”. Mitchell TE, Gronsky R, Van Tendeloo G Pergamon Press, Oxford, page 401 (1992).
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“Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides”. Nikolaev AV, Michel KH, Copley JRD Plenum Press, New York, page 183 (1999).
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“Fundamental aspects of an analytical glow discharge”. van Straaten M, Gijbels R Royal Society of Chemistry, Cambridge, page 130 (1993).
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“Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis”. Struyf H, van Roy W, van Vaeck L, Gijbels R, Caravatti P San Francisco Press, San Francisco, Calif., page 595 (1993).
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“Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
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“Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
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“Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides”. Oleshko V, Gijbels R, Jacob W Spie, Washington, D.C., page 326 (1998).
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“Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2007).
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“Charcaterization by high-resolution transmission electron microscopy”. van Landuyt J, Van Tendeloo G Stt, Den Haag, page 187 (1998).
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“Photographic materials”. Verlinden G, Gijbels R, Geuens I Surface Spectra IM, Chichester, page 727 (2001).
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“Analysis of thermal waters by ICP-MS”. Veldeman E, Van 't dack L, Gijbels R, Campbell M, Vanhaecke F, Vanhoe H, Vandecasteele C The Royal Society of Chemistry, Cambridge, page 25 (1991).
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“Geothermal water analysis by X-ray fluorescence and neutron activation”. van Grieken R, Gijbels R, Blommaert W, Vandelannoote R, Van 't dack L US Energy Research and Development Administration, S.l., page 368 (1978).
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“Laser microprobe mass spectrometry: local surface analysis of organic and inorganic compounds”. van Vaeck L, van Roy W, Struyf H, Poels K, Gijbels R Vch, Weinheim, page 354 (1997).
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“Metals and alloys”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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“Metals and alloys: 2: phase transformations”. Schryvers D, Van Tendeloo G Vch, Weinheim, page 80 (1997).
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“Microscopy of gemmological materials”. van Landuyt J, van Bockstael MHG, van Royen J Vch, Weinheim, page 293 (1997).
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“Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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“Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1996).
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“Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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“Analysis of nonconducting materials by dc glow discharge spectrometry”. Bogaerts A, Schelles W, van Grieken R Wiley, Chichester, page 293 (2003).
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“Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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“A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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“Introduction”. Vertes A, Gijbels R, Adams F Wiley, New York, page 1 (1993).
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“Lasers in mass spectrometry: organic and inorganic instrumentation”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 7 (1993).
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“Mass spectrometry, inorganic”. Adams F, Gijbels R, Jambers W, van Grieken R Wiley, Chichester, page 2650 (1998).
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“Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods”. Vertes A, Gijbels R Wiley, New York, page 127 (1993).
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