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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
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UA library record |
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Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
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|
UA library record |
|
|
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van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Structural characterization of organic molecules by laser mass spectrometry |
1993 |
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|
UA library record |
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Adams, F.; Gijbels, R.; Van Grieken, R. |
Inorganic mass spectrometry |
1988 |
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UA library record |
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Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. |
Structural characterization of SnS crystals formed by chemical vapour deposition |
2017 |
Journal of microscopy
T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND |
268 |
2 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
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|
UA library record |
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