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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Szalóki, I.; Braun, M.; Van Grieken, R. |
Quantitative characterisation of the leaching of lead and other elements from glazed surfaces of historical ceramics |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
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Szalóki, I.; Osán, J.; Ro, C.-U.; Van Grieken, R. |
Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
|
UA library record; WoS full record; WoS citing articles |
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Injuk, J.; Van Grieken, R. |
Sample preparation for X-ray fluorescence analysis |
2000 |
|
15 |
|
UA library record |
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de Bock, L.A.; Joos, P.E.; Noone, K.J.; Pockalny, R.A.; Van Grieken, R.E. |
Single particle analysis of aerosols, observed in the marine boundary layer during the Monterey Area Ship Tracks Experiment (MAST), with respect to cloud droplet formation |
2000 |
Journal of atmospheric chemistry |
37 |
|
UA library record; WoS full record; WoS citing articles |
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Jambers, W.; Dekov, V.; Van Grieken, R. |
Single particle and inorganic characterization of rainwater collected above the North Sea |
2000 |
The science of the total environment |
256 |
|
UA library record; WoS full record; WoS citing articles |
|
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Smekens, A.; Berghmans, P.; Van Grieken, R. |
The size distribution and surface area of soot emitted by different sources |
2000 |
Journal of aerosol science |
31 |
|
UA library record |
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van Dyck, K.; Robberecht, H.; van Cauwenbergh, R.; Deelstra, H.; Arnaud, J.; Willemyns, L.; Benijts, F.; Centeno, J.A.; Taylor, H.; Soares, M.E.; Bastos, M.L.; Ferreira, M.A.; d'Haese, P.C.; Lamberts, L.V.; Hoenig, M.; Knapp, G.; Lugowski, S.J.; Moens, L.; Riondato, J.; Van Grieken, R.; Claes, M.; Verheyen, R.; Clement, L.; Uytterhoeven, M. |
Spectrometric determination of silicon in food and biological samples: an interlaboratory trial |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
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Van Grieken, R.; Injuk, J.; de Bock, L.; van Malderen, H. |
Study of individual particle types and heavy metal deposition for North Sea aerosols using micro and trace analysis techniques |
2000 |
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UA library record |
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Worobiec, A.; de Hoog, J.; Osán, J.; Szalóki, I.; Joos, P.; Van Grieken, R. |
Unconventional microanalysis for low-Z, volatile and organic aerosol compounds |
2000 |
Journal of aerosol science |
31 |
|
UA library record |
|
|
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Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. |
X-ray spectrometry |
2000 |
Analytical chemistry |
72 |
|
UA library record; WoS full record; WoS citing articles |
|
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Van Grieken, R.E. |
X-ray spectrometry |
2000 |
|
15 |
|
UA library record |
|
|
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Bogaerts, A. |
Glow discharge mass spectrometry, methods |
2000 |
|
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UA library record |
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Chang, K.; Peeters, F.M. |
Asymmetric stark shifts in InGaAs/GaAs near-surface quantum wells: the image charge effect |
2000 |
Journal of applied physics |
88 |
20 |
UA library record; WoS full record; WoS citing articles |
|
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Bogaerts, A.; Gijbels, R.; Serikov, V.V. |
Calculation of gas heating in direct current argon glow discharges |
2000 |
Journal of applied physics |
87 |
63 |
UA library record; WoS full record; WoS citing articles |
|
|
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Reijniers, J.; Peeters, F.M. |
Diffusive transport in the hybrid Hall effect device |
2000 |
Journal of applied physics |
87 |
12 |
UA library record; WoS full record; WoS citing articles |
|
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Nistor, L.; Bender, H.; Vantomme, A.; Wu, M.F.; van Landuyt, J.; O'Donnell, K.P.; Martin, R.; Jacobs, K.; Moerman, I. |
Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer |
2000 |
Applied physics letters |
77 |
44 |
UA library record; WoS full record; WoS citing articles |
|
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Kaganovich, I.; Misina, M.; Berezhnoi, S.; Gijbels, R. |
Electron Boltzmann kinetic equation averaged over fast electron bouncing and pitch-angle scattering for fast modeling of electron cyclotron resonance discharge |
2000 |
Physical review : E : statistical, nonlinear, and soft matter physics |
61 |
31 |
UA library record; WoS full record; WoS citing articles |
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Razavi, F.S.; Gross, G.; Habermeier, H.-U.; Lebedev, O.; Amelinckx, S.; Van Tendeloo, G.; Vigliante, A. |
Epitaxial strain induced metal insulator transition in La0.9Sr0.1MnO3 and La0.88Sr0.1MnO3 thin films |
2000 |
Applied physics letters |
76 |
91 |
UA library record; WoS full record; WoS citing articles |
|
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Li, H.; Bender, H.; Conard, T.; Maex, K.; Gutakovskii, A.; van Landuyt, J.; Froyen, L. |
Interaction of a Ti-capped Co thin film with Si3N4 |
2000 |
Applied physics letters |
77 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
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Yan, M.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J. |
Spatial behavior of energy relaxation of electrons in capacitively coupled discharges: comparison between Ar and SiH4 |
2000 |
Journal of applied physics |
87 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
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Van Tendeloo, G.; Krekels, T. |
Identification of new superconducting compounds by electron microscopy |
2000 |
|
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
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UA library record |
|
|
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
|
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UA library record |
|
|
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Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
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UA library record |
|
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de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. |
XPS study of ion induced oxidation of silicon with and without oxygen flooding |
2000 |
|
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UA library record |
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van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. |
A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source |
2000 |
European mass spectrometry |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
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Yan, M.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. |
Electron energy distribution function in capacitively coupled RF discharges: differences between electropositive Ar and electronegative SiH4 discharges |
2000 |
Plasma sources science and technology |
9 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al. |
Comparative study of structural properties and photoluminescence in InGaN layers with a high In content |
2000 |
Internet journal of nitride semiconductor research
T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS |
5 |
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UA library record; WoS full record; |
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