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Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices”. Marmorkos IK, Schweigert VA, Peeters FM, Lok JGS, , 2769 (1996)
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Charged-impurity correlations in a δ-doped quantum barrier”. Koenraad PM, Shi JM, van de Stadt AFW, Smets A, Perenboom JAAJ, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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A cyclotron resonance study of the resonant polaron coupling in CdTe/CdMgTe quantum wells”. Chang CC, Michels JG, Cheng HH, Nicholas RJ, Peeters FM, Wu XG, Ossau W, Waag A, Landwehr G, , 383 (1997)
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Devices consisting of hybrid systems: ferro-magnetic and superconducting disks on top of a heterojunction”. Peeters FM, Li XQ, Matulis A, , 253 (1997)
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Effects of the DX centers on electronic structure of a δ-doped quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2355 (1996)
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Electron correlation effects in quantum dots”. Matulis A, Peeters FM, , 1875 (1995)
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High field magnetotransport in a Ga0.8In0.2As quantum well with a parallel δ-layer”. van der Burgt M, Karavolas VC, Peeters FM, Singleton J, Nicholas RJ, Herlach F, Harris JJ, van Hove M, Borghs G, , 588 (1995)
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Magnetic-field-induced metal-insulator transition in GaAs/AlGaAs quantum wells and superlattices”. Hilber W, Helm M, Hauke W, Peeters FM, Alavi K, Pathak RN, , 196 (1995)
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Magnetic freeze-out induced transition from three- to two-dimensional magnetotransport in Si-δ-doped InSb layers grown on GaAs”. Bogaerts R, de Keyser A, van Bockstal L, Herlach F, Karavolas VC, Peeters FM, Borghs G, , 706 (1995)
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Measuring quantum Hall resistors in pulsed magnetic fields”. van der Burgt M, Peeters FM, Singleton J, Nicholas RJ, Herlach F, Harris JJ, Foxon CT, , 750 (1995)
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Melting of a quantum Wigner crystal in bi-layer structures”. Goldoni G, Peeters FM, , 2451 (1996)
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Modification of the 2D electronic properties in Si-δ-doped InSb due to surface effects”. de Keyser A, Bogaerts R, van Bockstal L, Herlach F, Karavolas VC, Peeters FM, van de Graaf W, Borghs G, , 383 (1997)
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The morphology, structure and texture of carbon nanotubes: an electron microscopy study”. Amelinckx S, Bernaerts D, Van Tendeloo G, van Landuyt J, Lucas AA, Mathot M, Lambin P, , 515 (1995)
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Orientation fluctuations, diffuse scattering and orientational order in solid C60”. Michel KH, Copley JRD World Scientific, Singapore, page 381 (1996).
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Precision magnetometry on a submicron scale”. Geim AK, Lok JGS, Maan JC, Dubonos SV, Li XQ, Peeters FM, Nazarov YV, , 3311 (1996)
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Quantum oscillations in the Hall effect of thin Sc1-xErxAs epitaxial layers burried in GaAs”. Bogaerts R, de Keyser A, Herlach F, Peeters FM, DeRosa F, Palmstrøm CJ, Brehmer D, Allen SJ, , 596 (1995)
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Resonant magnetopolaron effects in GaAs/AlGaAs MQWs at high magnetic fields”. Wang YJ, Nickel HA, McCombe BD, Peeters FM, Hai GQ, Shi JM, Devreese JT, Wu XG, , 797 (1997)
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Self-consistent g* factor and spin-split Landau levels in strong magnetic fields and at low temperatures”. Xu W, Vasilopoulos P, Das MP, Peeters FM, , 743 (1995)
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Structural aspects of carbon nanotubes”. Bernaerts D, Amelinckx S, Zhang XB, Van Tendeloo G, van Landuyt J, , 551 (1995)
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Theory of the magneto-transport in a nonplanar two dimensional electron gas”. Badalian SM, Ibrahim IS, Peeters FM, , 327 (1997)
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Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
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Scanning microanalysis”. Oleshko V, Gijbels R Wiley-VCH, Weinheim, page 427 (1997).
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Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
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Analysis of nonconducting materials by dc glow discharge spectrometry”. Bogaerts A, Schelles W, van Grieken R Wiley, Chichester, page 293 (2003).
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Depth profiling of coated steel wires by GDMS”. van Straaten M, Butaye L, Gijbels R, , 629 (1992)
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Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 479 (1992)
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Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, , 479 (1991)
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Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis”. Oleshko VP, Gijbels R, Amelinckx S Wiley, Chichester, page 1 (2013).
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A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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