Tang, X.; Reckinger, N.; Poncelet, O.; Louette, P.; Urena, F.; Idrissi, H.; Turner, S.; Cabosart, D.; Colomer, J.-F.; Raskin, J.-P.; Hackens, B.; Francis, L.A. |
Damage evaluation in graphene underlying atomic layer deposition dielectrics |
2015 |
Scientific reports |
5 |
18 |
UA library record; WoS full record; WoS citing articles |