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Author
Title
Year
Publication
Volume
Times cited
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Geuens, I.
;
Nys, B.
;
Naudts, J.
;
Gijbels, R.
;
Jacob, W.
;
van Espen, P.
The primary energy dependence of backscattered electron images up to 100 keV
1991
Scanning microscopy
5
3
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