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Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. | ||||
Title | Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? | Type | A1 Journal article | ||
Year | 2003 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 98 | Issue | Pages | 27-42 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher ![]() |
Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000186831500003 | Publication Date | 2003-04-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 26 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2003 IF: 1.665 | |||
Call Number | UA @ lucian @ c:irua:47516 | Serial | 1749 | ||
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