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Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. | ||||
Title | High-resolution electron microscopy : from imaging toward measuring | Type | A1 Journal article | ||
Year | 2002 | Publication | IEEE transactions on instrumentation and measurement | Abbreviated Journal | Ieee T Instrum Meas |
Volume | 51 | Issue | 4 | Pages | 611-615 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher ![]() |
Place of Publication | New York, N.Y. | Editor | ||
Language | Wos | 000178992000010 | Publication Date | 2003-01-03 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0018-9456; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.456 | Times cited | 13 | Open Access | |
Notes | Approved | Most recent IF: 2.456; 2002 IF: 0.592 | |||
Call Number | UA @ lucian @ c:irua:47521 | Serial | 1450 | ||
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