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Author | Hadermann, J.; Palatinus, L. | ||||
Title | Introducton to the special issue on electron crystallography | Type | Editorial | ||
Year | 2019 | Publication | And Materials | Abbreviated Journal | |
Volume | 75 | Issue | 4 | Pages | 462-462 |
Keywords | Editorial; Electron microscopy for materials research (EMAT) | ||||
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Place of Publication | Editor | |||
Language | Wos | 000480512600028 | Publication Date | 2019-08-05 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | ||
Impact Factor | Times cited | 2 | Open Access | ||
Notes | ; ; | Approved | Most recent IF: NA | ||
Call Number | UA @ admin @ c:irua:161845 | Serial | 5389 | ||
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Author | Poppe, R.; Roth, N.; Neder, R.B.; Palatinus, L.; Iversen, B.B.; Hadermann, J. | ||||
Title | Refining short-range order parameters from the three-dimensional diffuse scattering in single-crystal electron diffraction data | Type | A1 Journal article | ||
Year | 2024 | Publication | IUCrJ | Abbreviated Journal | |
Volume | 11 | Issue | 1 | Pages | 82-91 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | Our study compares short-range order parameters refined from the diffuse scattering in single-crystal X-ray and single-crystal electron diffraction data. Nb0.84CoSb was chosen as a reference material. The correlations between neighbouring vacancies and the displacements of Sb and Co atoms were refined from the diffuse scattering using a Monte Carlo refinement in DISCUS. The difference between the Sb and Co displacements refined from the diffuse scattering and the Sb and Co displacements refined from the Bragg reflections in single-crystal X-ray diffraction data is 0.012 (7) angstrom for the refinement on diffuse scattering in single-crystal X-ray diffraction data and 0.03 (2) angstrom for the refinement on the diffuse scattering in single-crystal electron diffraction data. As electron diffraction requires much smaller crystals than X-ray diffraction, this opens up the possibility of refining short-range order parameters in many technologically relevant materials for which no crystals large enough for single-crystal X-ray diffraction are available. | ||||
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Corporate Author | Thesis | ||||
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Place of Publication | Editor | |||
Language | Wos | 001168018300012 | Publication Date | 2023-12-14 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 2052-2525 | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 3.9 | Times cited | Open Access | ||
Notes | Approved | Most recent IF: 3.9; 2024 IF: 5.793 | |||
Call Number | UA @ admin @ c:irua:205513 | Serial | 9170 | ||
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