Records |
Author |
Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Title |
Low- or high-angle Ar ion-beam etching to create ramp-type Josephson junctions |
Type |
A1 Journal article |
Year |
1996 |
Publication |
Superconductor science and technology |
Abbreviated Journal |
Supercond Sci Tech |
Volume |
9 |
Issue |
|
Pages |
978-984 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher ![sorted by Publisher field, descending order (down)](img/sort_desc.gif) |
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Place of Publication |
Bristol |
Editor |
|
Language |
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Wos |
A1996VR54700009 |
Publication Date |
2002-08-25 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
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Edition |
|
ISSN |
0953-2048;1361-6668; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.325 |
Times cited |
10 |
Open Access |
|
Notes |
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Approved |
COMPUTER SCIENCE, INTERDISCIPLINARY 11/104 Q1 # PHYSICS, MATHEMATICAL 1/53 Q1 # |
Call Number |
UA @ lucian @ c:irua:15469 |
Serial |
1851 |
Permanent link to this record |
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Author |
Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Title |
Study of ramp-type Josephson junctions by HREM |
Type |
A1 Journal article |
Year |
1997 |
Publication |
Electronic Applications; Vol 2: Large Scale And Power Applications |
Abbreviated Journal |
|
Volume |
|
Issue |
158 |
Pages |
49-52 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-delta high-T-c superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-delta. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties. |
Address |
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Corporate Author |
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Thesis |
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Publisher ![sorted by Publisher field, descending order (down)](img/sort_desc.gif) |
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Place of Publication |
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Editor |
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Language |
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Wos |
000071955200012 |
Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
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Edition |
|
ISSN |
0-7503-0487-1 |
ISBN |
|
Additional Links |
UA library record; WoS full record; |
Impact Factor |
|
Times cited |
|
Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:102941 |
Serial |
3333 |
Permanent link to this record |