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Author | Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. | ||||
Title | Ultra-high resolution electron tomography for materials science : a roadmap | Type | A1 Journal article | ||
Year | 2011 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 17 | Issue | S:2 | Pages | 934-935 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | Publication Date | 2011-10-07 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
Impact Factor | 1.891 | Times cited | Open Access | ||
Notes | Approved | Most recent IF: 1.891; 2011 IF: 3.007 | |||
Call Number | UA @ lucian @ c:irua:96554 | Serial | 3792 | ||
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