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Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. | ||||
Title | High-resolution electron microscopy and electron tomography: resolution versus precision | Type | A1 Journal article | ||
Year | 2002 | Publication | Journal of structural biology | Abbreviated Journal | J Struct Biol |
Volume | 138 | Issue | Pages | 21-33 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | New York | Editor | ||
Language | Wos | 000177978800003 | Publication Date | 2002-09-17 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1047-8477; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.767 | Times cited | 33 | Open Access | |
Notes | Approved | Most recent IF: 2.767; 2002 IF: 4.194 | |||
Call Number | UA @ lucian @ c:irua:47520 | Serial | 1446 | ||
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